JPS5618760A - Microscopic change measuring device for resistance capacity in high stability and high sensitivity - Google Patents

Microscopic change measuring device for resistance capacity in high stability and high sensitivity

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Publication number
JPS5618760A
JPS5618760A JP9402679A JP9402679A JPS5618760A JP S5618760 A JPS5618760 A JP S5618760A JP 9402679 A JP9402679 A JP 9402679A JP 9402679 A JP9402679 A JP 9402679A JP S5618760 A JPS5618760 A JP S5618760A
Authority
JP
Japan
Prior art keywords
microscopic
coupled
circuits
measuring device
change
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9402679A
Other languages
Japanese (ja)
Inventor
Bunjirou Ichijiyou
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP9402679A priority Critical patent/JPS5618760A/en
Publication of JPS5618760A publication Critical patent/JPS5618760A/en
Pending legal-status Critical Current

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  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE: To measure a resistance capacity for microscopic change in high stability and high sensitivity by a method wherein parallel turing circuits are coupled elecand a change arising at connecting a sample thereto are detected.
CONSTITUTION: Two parallel tuning circuits L1-R1-C1v, L1'-R1'-C1v' are coupled electrostatically to a tank circuit for a high frequency power supply with frequency f and internal resistance rp through microscopic capacities C01, C01', and loss measuring voltages eR, eR' and capacity measuring voltages eC, eC' are induced on voltage pickup secondary coils being coupled with L1, L1' according to coefficients of mutual induction MR, MR', MC, MC'. A microscopic change in samples RX, CX can be measured under maximum sensitivity by adjusting the circuits through satisfying a given condition with the samples RX, CX being connected.
COPYRIGHT: (C)1981,JPO&Japio
JP9402679A 1979-07-24 1979-07-24 Microscopic change measuring device for resistance capacity in high stability and high sensitivity Pending JPS5618760A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9402679A JPS5618760A (en) 1979-07-24 1979-07-24 Microscopic change measuring device for resistance capacity in high stability and high sensitivity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9402679A JPS5618760A (en) 1979-07-24 1979-07-24 Microscopic change measuring device for resistance capacity in high stability and high sensitivity

Publications (1)

Publication Number Publication Date
JPS5618760A true JPS5618760A (en) 1981-02-21

Family

ID=14099043

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9402679A Pending JPS5618760A (en) 1979-07-24 1979-07-24 Microscopic change measuring device for resistance capacity in high stability and high sensitivity

Country Status (1)

Country Link
JP (1) JPS5618760A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60173297A (en) * 1984-02-15 1985-09-06 株式会社福田組 Drilling amchine

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60173297A (en) * 1984-02-15 1985-09-06 株式会社福田組 Drilling amchine
JPH0310000B2 (en) * 1984-02-15 1991-02-12 Fukudagumi Kk

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