JPS56156663A - Double focusing mass spectrometer - Google Patents

Double focusing mass spectrometer

Info

Publication number
JPS56156663A
JPS56156663A JP5892080A JP5892080A JPS56156663A JP S56156663 A JPS56156663 A JP S56156663A JP 5892080 A JP5892080 A JP 5892080A JP 5892080 A JP5892080 A JP 5892080A JP S56156663 A JPS56156663 A JP S56156663A
Authority
JP
Japan
Prior art keywords
mass spectrometer
angle
double focusing
focusing mass
ionic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5892080A
Other languages
Japanese (ja)
Other versions
JPH0366778B2 (en
Inventor
Takehiro Takeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP5892080A priority Critical patent/JPS56156663A/en
Publication of JPS56156663A publication Critical patent/JPS56156663A/en
Publication of JPH0366778B2 publication Critical patent/JPH0366778B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/20Magnetic deflection

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To enhance the sensitivity of a mass spectrometer by restricting both the angle of each part and the ratio of the dimension of each part of the spectrometer within a given range. CONSTITUTION:Concentric double toroidal electrodes A and B deflect an ionic beam at an approximately right angle. An ionic beam discharged from these electrodes A and B is further deflected by a deflection magnetic field at an approximately right angle. The angle of each part, and the ratio of the dimension of each part of a mass spectrometer are restricted within the following ranges. 0.9<=re/rm<=1.2, 0.8<=RE1/re<=2.0, 0.5<=RE2/re1.2, 32 deg.<=Ep1<=36 deg., -10 deg.<= Ep2<=-8 deg., 0.9rm<=le' <=1.2rm, 0.4re/Re 0.6. Ionic beams to and from the deflection magnetic field are both oblique to the field.
JP5892080A 1980-05-01 1980-05-01 Double focusing mass spectrometer Granted JPS56156663A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5892080A JPS56156663A (en) 1980-05-01 1980-05-01 Double focusing mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5892080A JPS56156663A (en) 1980-05-01 1980-05-01 Double focusing mass spectrometer

Publications (2)

Publication Number Publication Date
JPS56156663A true JPS56156663A (en) 1981-12-03
JPH0366778B2 JPH0366778B2 (en) 1991-10-18

Family

ID=13098254

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5892080A Granted JPS56156663A (en) 1980-05-01 1980-05-01 Double focusing mass spectrometer

Country Status (1)

Country Link
JP (1) JPS56156663A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103367091A (en) * 2013-07-17 2013-10-23 中国科学院地质与地球物理研究所 Inert gas magnetic type mass spectrometer and design method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51121390A (en) * 1975-04-14 1976-10-23 Barian Matsuto Gmbh Quantity analyzer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51121390A (en) * 1975-04-14 1976-10-23 Barian Matsuto Gmbh Quantity analyzer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103367091A (en) * 2013-07-17 2013-10-23 中国科学院地质与地球物理研究所 Inert gas magnetic type mass spectrometer and design method

Also Published As

Publication number Publication date
JPH0366778B2 (en) 1991-10-18

Similar Documents

Publication Publication Date Title
ATE398335T1 (en) MINIATURIZED ION TRAP MASS SPECTROMETER
FI874130A (en) FOERBAETTRAT FAERGDISPLAYSYSTEM OCH KATODSTRAOLROER.
GB1473054A (en) Detection of ions by mass spectrometry
ATE53705T1 (en) CATHODE RAY TUBE AND COLOR INDICATOR.
JPS575256A (en) Double focusing mass spectrograph
JPS56156663A (en) Double focusing mass spectrometer
JPS5750748A (en) Cathode ray tube
ES468779A1 (en) Shadow mask having apertures divided into symmetrical halves by isolated conductors
GB1460987A (en) Mass spectrometers
JPS5535449A (en) Electromagnetic focusing type cathode ray tube
JPS57101324A (en) Electron beam deflector
JPS57157448A (en) Mass spectrometer
JPS57202630A (en) Electrostatic deflector
JPS57157449A (en) Mass spectrograph
JPS5638758A (en) Mass spectrograph
JPS54133070A (en) Constituent for electron gun
JPS5610926A (en) Electron beam drawing device
JPS5220090A (en) Ion micro analyzer
JPS55108153A (en) In-line type electron gun
JPS5591540A (en) Electron-gun structure
SU626665A1 (en) Quarter-wave resonance system of cyclotron
SU652743A1 (en) Electron linear accelerator
JPS5336292A (en) Analyzer for charged particles
JPS57199146A (en) Electron gun structure
JPS55122349A (en) Virtual image type double convergence mass spectrometer