JPS56156663A - Double focusing mass spectrometer - Google Patents
Double focusing mass spectrometerInfo
- Publication number
- JPS56156663A JPS56156663A JP5892080A JP5892080A JPS56156663A JP S56156663 A JPS56156663 A JP S56156663A JP 5892080 A JP5892080 A JP 5892080A JP 5892080 A JP5892080 A JP 5892080A JP S56156663 A JPS56156663 A JP S56156663A
- Authority
- JP
- Japan
- Prior art keywords
- mass spectrometer
- angle
- double focusing
- focusing mass
- ionic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/20—Magnetic deflection
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To enhance the sensitivity of a mass spectrometer by restricting both the angle of each part and the ratio of the dimension of each part of the spectrometer within a given range. CONSTITUTION:Concentric double toroidal electrodes A and B deflect an ionic beam at an approximately right angle. An ionic beam discharged from these electrodes A and B is further deflected by a deflection magnetic field at an approximately right angle. The angle of each part, and the ratio of the dimension of each part of a mass spectrometer are restricted within the following ranges. 0.9<=re/rm<=1.2, 0.8<=RE1/re<=2.0, 0.5<=RE2/re1.2, 32 deg.<=Ep1<=36 deg., -10 deg.<= Ep2<=-8 deg., 0.9rm<=le' <=1.2rm, 0.4re/Re 0.6. Ionic beams to and from the deflection magnetic field are both oblique to the field.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5892080A JPS56156663A (en) | 1980-05-01 | 1980-05-01 | Double focusing mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5892080A JPS56156663A (en) | 1980-05-01 | 1980-05-01 | Double focusing mass spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56156663A true JPS56156663A (en) | 1981-12-03 |
JPH0366778B2 JPH0366778B2 (en) | 1991-10-18 |
Family
ID=13098254
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5892080A Granted JPS56156663A (en) | 1980-05-01 | 1980-05-01 | Double focusing mass spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56156663A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103367091A (en) * | 2013-07-17 | 2013-10-23 | 中国科学院地质与地球物理研究所 | Inert gas magnetic type mass spectrometer and design method |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51121390A (en) * | 1975-04-14 | 1976-10-23 | Barian Matsuto Gmbh | Quantity analyzer |
-
1980
- 1980-05-01 JP JP5892080A patent/JPS56156663A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51121390A (en) * | 1975-04-14 | 1976-10-23 | Barian Matsuto Gmbh | Quantity analyzer |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103367091A (en) * | 2013-07-17 | 2013-10-23 | 中国科学院地质与地球物理研究所 | Inert gas magnetic type mass spectrometer and design method |
Also Published As
Publication number | Publication date |
---|---|
JPH0366778B2 (en) | 1991-10-18 |
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