JPS56137151A - Multi-frequency type apparatus for and method of testing eddy current - Google Patents
Multi-frequency type apparatus for and method of testing eddy currentInfo
- Publication number
- JPS56137151A JPS56137151A JP2825881A JP2825881A JPS56137151A JP S56137151 A JPS56137151 A JP S56137151A JP 2825881 A JP2825881 A JP 2825881A JP 2825881 A JP2825881 A JP 2825881A JP S56137151 A JPS56137151 A JP S56137151A
- Authority
- JP
- Japan
- Prior art keywords
- eddy current
- type apparatus
- frequency type
- testing
- testing eddy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
- G01N27/9053—Compensating for probe to workpiece spacing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/125,895 US4467281A (en) | 1980-02-29 | 1980-02-29 | Multi frequency eddy current test apparatus with intermediate frequency processing |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56137151A true JPS56137151A (en) | 1981-10-26 |
Family
ID=22421957
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2825881A Pending JPS56137151A (en) | 1980-02-29 | 1981-02-27 | Multi-frequency type apparatus for and method of testing eddy current |
Country Status (3)
Country | Link |
---|---|
US (1) | US4467281A (ja) |
EP (1) | EP0035391A3 (ja) |
JP (1) | JPS56137151A (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59108955A (ja) * | 1982-12-13 | 1984-06-23 | Nippon Steel Corp | マルチプロ−ブコイルマルチ周波数渦流探傷装置 |
JPS59166857A (ja) * | 1983-03-11 | 1984-09-20 | Nippon Steel Corp | マルチプロ−ブ、マルチ周波数渦流探傷装置の信号処理回路 |
Families Citing this family (48)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ZA807387B (en) * | 1979-12-08 | 1981-11-25 | Metal Box Co Ltd | Containers |
BE892241A (fr) * | 1982-02-23 | 1982-06-16 | Dev Et D Industrialisation Des | Circuit de calcul rapide de la transformee de fourier discrete d'un signal, destine notamment a un appareil de controle par courants de foucault. |
FR2540630B1 (fr) * | 1983-02-08 | 1985-08-09 | Commissariat Energie Atomique | Sonde multibobines a courants de foucault munie d'un dispositif d'equilibrage des bobines |
US4629985A (en) * | 1984-04-11 | 1986-12-16 | Pa Incorporated | Method and apparatus for measuring defects in tubular members |
US4631533A (en) * | 1984-06-15 | 1986-12-23 | Westinghouse Electric Corp. | Display of eddy current detector data |
US4634975A (en) * | 1984-09-17 | 1987-01-06 | Progressive Dynamics, Inc. | Method and apparatus for producing electromagnetic surveillance fields |
FR2570501B1 (fr) * | 1984-09-20 | 1987-12-18 | Siderurgie Fse Inst Rech | Procede de detection de defauts de surface par courants de foucault et dispositif mettant en oeuvre ce procede |
US4860756A (en) * | 1985-07-11 | 1989-08-29 | The Johns Hopkins University | Electromagnetic bone healing sensor using a multi-coil sensor array |
US4855677A (en) * | 1988-03-11 | 1989-08-08 | Westinghouse Electric Corp. | Multiple coil eddy current probe and method of flaw detection |
US4924182A (en) * | 1989-01-09 | 1990-05-08 | The United States Of America As Represented By The Secretary Of The Navy | Eddy current method to measure distance between scanned surface and a subsurface defect |
US4922201A (en) * | 1989-01-09 | 1990-05-01 | The United States Of America As Represented By The Secretary Of The Navy | Eddy current method for measuring electrical resistivity and device for providing accurate phase detection |
USH879H (en) * | 1989-06-30 | 1991-01-01 | The United States Of America As Represented By The Secretary Of The Navy | Method and device for inspecting circumferentially conducting materials |
US5017869A (en) * | 1989-12-14 | 1991-05-21 | General Electric Company | Swept frequency eddy current system for measuring coating thickness |
US5047719A (en) * | 1990-05-25 | 1991-09-10 | The Failure Group, Inc. | Flexible coil assembly for reflectance-mode nondestructive eddy-current examination |
US5237271A (en) * | 1991-05-06 | 1993-08-17 | General Electric Company | Apparatus and method for non-destructive testing using multi-frequency eddy currents |
FR2735925B1 (fr) * | 1995-06-20 | 1997-09-12 | Intercontrole Sa | Dispositif de demodulation simultanee d'un signal multifrequentiel, notamment pour une mesure par courants de foucault |
KR0167727B1 (ko) * | 1996-05-07 | 1999-02-01 | 김광호 | 핸드폰의 마이크/헤드폰 잭을 이용한 무선 데이타 통신 시스템 |
DE29608664U1 (de) * | 1996-05-13 | 1997-09-18 | Debnar Beinssen, Angelika, Dipl.-Ing., 20149 Hamburg | Vorrichtung zum Werkstoffprüfen einer metallischen Wand |
US5963030A (en) * | 1998-03-30 | 1999-10-05 | Union Oil Company Of California | Pipe inspection apparatus and process |
US6337218B1 (en) | 1999-05-28 | 2002-01-08 | International Business Machines Corporation | Method to test devices on high performance ULSI wafers |
US6479989B2 (en) | 1999-10-13 | 2002-11-12 | Albert Rudolph Taylor | Eddy current probe with an adjustable bisected sensing end |
US6346807B1 (en) * | 1999-10-22 | 2002-02-12 | Bently Nevada Corporation | Digital eddy current proximity system: apparatus and method |
US7374477B2 (en) | 2002-02-06 | 2008-05-20 | Applied Materials, Inc. | Polishing pads useful for endpoint detection in chemical mechanical polishing |
US6924641B1 (en) * | 2000-05-19 | 2005-08-02 | Applied Materials, Inc. | Method and apparatus for monitoring a metal layer during chemical mechanical polishing |
US6878038B2 (en) * | 2000-07-10 | 2005-04-12 | Applied Materials Inc. | Combined eddy current sensing and optical monitoring for chemical mechanical polishing |
US6602724B2 (en) | 2000-07-27 | 2003-08-05 | Applied Materials, Inc. | Chemical mechanical polishing of a metal layer with polishing rate monitoring |
US6608495B2 (en) | 2001-03-19 | 2003-08-19 | Applied Materials, Inc. | Eddy-optic sensor for object inspection |
US6966816B2 (en) * | 2001-05-02 | 2005-11-22 | Applied Materials, Inc. | Integrated endpoint detection system with optical and eddy current monitoring |
US6803757B2 (en) | 2001-10-02 | 2004-10-12 | Bentley Nevada, Llc | Multi-coil eddy current proximity probe system |
US6811466B1 (en) * | 2001-12-28 | 2004-11-02 | Applied Materials, Inc. | System and method for in-line metal profile measurement |
GB2389909A (en) * | 2002-06-22 | 2003-12-24 | Hocking Ndt Ltd | Inductively coupled eddy current probe |
US7016795B2 (en) * | 2003-02-04 | 2006-03-21 | Applied Materials Inc. | Signal improvement in eddy current sensing |
US6945845B2 (en) * | 2003-03-04 | 2005-09-20 | Applied Materials, Inc. | Chemical mechanical polishing apparatus with non-conductive elements |
KR100505929B1 (ko) * | 2003-03-31 | 2005-08-04 | 삼성광주전자 주식회사 | 압축기 및 압축기의 배관연결방법 |
DE10324990B3 (de) * | 2003-06-03 | 2004-11-04 | Visit Video-Stroboskop Innovations-Technik Gmbh & Co. Kg | Vorrichtung zur Untersuchung eines flüssigen oder gasförmigen Mediums |
US7112960B2 (en) * | 2003-07-31 | 2006-09-26 | Applied Materials, Inc. | Eddy current system for in-situ profile measurement |
US7025658B2 (en) * | 2003-08-18 | 2006-04-11 | Applied Materials, Inc. | Platen and head rotation rates for monitoring chemical mechanical polishing |
US7113873B2 (en) * | 2003-11-26 | 2006-09-26 | General Electric Company | Method and system for using eddy current transducers in pressure measurements |
US6873149B1 (en) | 2003-11-26 | 2005-03-29 | General Electric Company | Method and system for eddy current proximity system noise reduction |
US7068041B2 (en) * | 2003-11-26 | 2006-06-27 | General Electric Company | Method and system for multi-frequency inductive ratio measurement |
EP1952135A4 (en) * | 2005-11-03 | 2011-12-14 | Coastal Res Corp | CONVIVIAL FOUCAULT CURRENT NETWORK |
US8337278B2 (en) * | 2007-09-24 | 2012-12-25 | Applied Materials, Inc. | Wafer edge characterization by successive radius measurements |
IL196343A0 (en) * | 2008-01-03 | 2009-09-22 | Soreq Nuclear Res Ct Israel At | Bone fracture detection |
JP5611214B2 (ja) | 2008-10-16 | 2014-10-22 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 渦電流利得の補償 |
JP5615831B2 (ja) * | 2008-11-14 | 2014-10-29 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 縁部分解能強化渦電流センサ |
CN101603947B (zh) * | 2009-07-08 | 2012-03-28 | 中国人民解放军国防科学技术大学 | 集成涡流无损检测系统 |
CN106442703B (zh) * | 2016-09-18 | 2019-06-04 | 中国医学科学院生物医学工程研究所 | 一种降低功耗的门控交变电磁激励的磁声成像装置及方法 |
WO2018080764A1 (en) | 2016-10-28 | 2018-05-03 | Applied Materials, Inc. | Core configuration with alternating posts for in-situ electromagnetic induction monitoring system |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2894203A (en) * | 1957-04-11 | 1959-07-07 | Robert W Cory | Multiple frequency eddy current testing apparatus |
US3626279A (en) * | 1970-05-15 | 1971-12-07 | Charles D Walden | Metal detector utilizing radio receiver and harmonic signal generator |
US4006407A (en) * | 1975-03-10 | 1977-02-01 | Magnaflux Corporation | Non-destructive testing systems having automatic balance and sample and hold operational modes |
FR2324003A1 (fr) * | 1975-09-09 | 1977-04-08 | Commissariat Energie Atomique | Procede de controle non destructif par courants de foucault et dispositif correspondant, utilisant une excitation multifrequence et permettant l'elimination de certains parametres |
US4107598A (en) * | 1976-02-02 | 1978-08-15 | Texaco Inc. | Electromagnetic wave logging system for determining resistivity and dielectric constant of earth formations |
US4170755A (en) * | 1977-08-24 | 1979-10-09 | Magnetic Analysis Corporation | FM transmitter and receiver for use with non-destructive testing apparatus including a moveable head |
DE2739873A1 (de) * | 1977-09-05 | 1979-03-08 | Fraunhofer Ges Forschung | Verfahren zur zerstoerungsfreien werkstoffpruefung nach dem wirbelstromverfahren |
US4207520A (en) * | 1978-04-06 | 1980-06-10 | The United States Of America As Represented By The Secretary Of The Air Force | Multiple frequency digital eddy current inspection system |
-
1980
- 1980-02-29 US US06/125,895 patent/US4467281A/en not_active Expired - Lifetime
-
1981
- 1981-02-27 EP EP81300836A patent/EP0035391A3/en not_active Withdrawn
- 1981-02-27 JP JP2825881A patent/JPS56137151A/ja active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59108955A (ja) * | 1982-12-13 | 1984-06-23 | Nippon Steel Corp | マルチプロ−ブコイルマルチ周波数渦流探傷装置 |
JPH0441300B2 (ja) * | 1982-12-13 | 1992-07-07 | Nippon Steel Corp | |
JPS59166857A (ja) * | 1983-03-11 | 1984-09-20 | Nippon Steel Corp | マルチプロ−ブ、マルチ周波数渦流探傷装置の信号処理回路 |
JPH0441302B2 (ja) * | 1983-03-11 | 1992-07-07 | Nippon Steel Corp |
Also Published As
Publication number | Publication date |
---|---|
US4467281A (en) | 1984-08-21 |
EP0035391A2 (en) | 1981-09-09 |
EP0035391A3 (en) | 1982-03-31 |
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