JPS56130652A - Metal discriminating device - Google Patents

Metal discriminating device

Info

Publication number
JPS56130652A
JPS56130652A JP3463680A JP3463680A JPS56130652A JP S56130652 A JPS56130652 A JP S56130652A JP 3463680 A JP3463680 A JP 3463680A JP 3463680 A JP3463680 A JP 3463680A JP S56130652 A JPS56130652 A JP S56130652A
Authority
JP
Japan
Prior art keywords
metal
output
discriminated
level
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3463680A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0322585B2 (enExample
Inventor
Kenji Iwanaga
Hideo Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP3463680A priority Critical patent/JPS56130652A/ja
Publication of JPS56130652A publication Critical patent/JPS56130652A/ja
Publication of JPH0322585B2 publication Critical patent/JPH0322585B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Testing Of Coins (AREA)
JP3463680A 1980-03-18 1980-03-18 Metal discriminating device Granted JPS56130652A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3463680A JPS56130652A (en) 1980-03-18 1980-03-18 Metal discriminating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3463680A JPS56130652A (en) 1980-03-18 1980-03-18 Metal discriminating device

Publications (2)

Publication Number Publication Date
JPS56130652A true JPS56130652A (en) 1981-10-13
JPH0322585B2 JPH0322585B2 (enExample) 1991-03-27

Family

ID=12419887

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3463680A Granted JPS56130652A (en) 1980-03-18 1980-03-18 Metal discriminating device

Country Status (1)

Country Link
JP (1) JPS56130652A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61201176U (enExample) * 1985-05-31 1986-12-17
WO2003027659A1 (en) * 2001-09-21 2003-04-03 Tok Engineering Co., Ltd. Method for detecting metallic foreign matter and system for detecting metallic foreign matter
JP4756409B1 (ja) * 2011-02-18 2011-08-24 大日機械工業株式会社 交番磁場を利用した非破壊検査装置および非破壊検査方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3884141B2 (ja) * 1997-10-09 2007-02-21 株式会社イシダ 金属検出機および金属検出システム
EP2063262B1 (en) * 2006-09-14 2013-03-06 Panasonic Corporation Metal identifying device and metal identifying method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5543420A (en) * 1978-09-25 1980-03-27 Saginomiya Seisakusho Inc Metallic material examination device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5543420A (en) * 1978-09-25 1980-03-27 Saginomiya Seisakusho Inc Metallic material examination device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61201176U (enExample) * 1985-05-31 1986-12-17
WO2003027659A1 (en) * 2001-09-21 2003-04-03 Tok Engineering Co., Ltd. Method for detecting metallic foreign matter and system for detecting metallic foreign matter
US6958603B2 (en) 2001-09-21 2005-10-25 Tok Engineering Co., Ltd. Method for detecting metallic foreign matter and system for detecting metallic foreign matter
US7102347B2 (en) 2001-09-21 2006-09-05 Tok Engineering Co., Ltd. Metallic contaminant detecting method and apparatus therefor
JP4756409B1 (ja) * 2011-02-18 2011-08-24 大日機械工業株式会社 交番磁場を利用した非破壊検査装置および非破壊検査方法
WO2012111500A1 (ja) * 2011-02-18 2012-08-23 大日機械工業株式会社 交番磁場を利用した非破壊検査装置および非破壊検査方法
US9453817B2 (en) 2011-02-18 2016-09-27 DAINICHI Machine and Engineering Co., Ltd. Nondestructive inspection device using alternating magnetic field, and nondestructive inspection method

Also Published As

Publication number Publication date
JPH0322585B2 (enExample) 1991-03-27

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