JPS56129872A - Inspection of printed circuit board - Google Patents

Inspection of printed circuit board

Info

Publication number
JPS56129872A
JPS56129872A JP3372480A JP3372480A JPS56129872A JP S56129872 A JPS56129872 A JP S56129872A JP 3372480 A JP3372480 A JP 3372480A JP 3372480 A JP3372480 A JP 3372480A JP S56129872 A JPS56129872 A JP S56129872A
Authority
JP
Japan
Prior art keywords
pins
valid
cpu7
position information
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3372480A
Other languages
Japanese (ja)
Inventor
Sumio Nagashima
Nobushi Suzuki
Katsuhiko Aoyanagi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP3372480A priority Critical patent/JPS56129872A/en
Publication of JPS56129872A publication Critical patent/JPS56129872A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To shorten the time of inspecting the pattern conduction with a simple and quick supply of an inspection signal only to a valid pin by memorizing the position information of the valid pin separated from a valid contact pin by way of a mask and a conductive plate. CONSTITUTION:As soon as a mask 2 making up an insulator basic pattern sheet is pressed against a contact pin 4, valid pins 4a... are separated from invalid pins 4b.... Based on the separation of the pins 4a... through a conductor 10 making up a calibrating substrate, the position information of the pins 4a... is memorized in a memory section of a CPU7. After such a quick separation of the valid pins, an inspection signal from the CPU7 is applied only to a point based on the position information memorized of a substrate 1 to be tested and the result is checked up with a correct connection state from a reference connection file 8 read out through the CPU7. Such a simple and quick supply of the inspection signal only to the valid pins enables inspection of the pattern conduction on a printed circuit board in a short space of time.
JP3372480A 1980-03-17 1980-03-17 Inspection of printed circuit board Pending JPS56129872A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3372480A JPS56129872A (en) 1980-03-17 1980-03-17 Inspection of printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3372480A JPS56129872A (en) 1980-03-17 1980-03-17 Inspection of printed circuit board

Publications (1)

Publication Number Publication Date
JPS56129872A true JPS56129872A (en) 1981-10-12

Family

ID=12394340

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3372480A Pending JPS56129872A (en) 1980-03-17 1980-03-17 Inspection of printed circuit board

Country Status (1)

Country Link
JP (1) JPS56129872A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6348163U (en) * 1986-09-13 1988-04-01
JPH0297682U (en) * 1989-01-20 1990-08-03
JPH02236466A (en) * 1988-11-25 1990-09-19 Internatl Business Mach Corp <Ibm> Antistatic mask

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6348163U (en) * 1986-09-13 1988-04-01
JPH02236466A (en) * 1988-11-25 1990-09-19 Internatl Business Mach Corp <Ibm> Antistatic mask
JPH0654337B2 (en) * 1988-11-25 1994-07-20 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン Antistatic mask
JPH0297682U (en) * 1989-01-20 1990-08-03

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