JPS56128556U - - Google Patents

Info

Publication number
JPS56128556U
JPS56128556U JP2506080U JP2506080U JPS56128556U JP S56128556 U JPS56128556 U JP S56128556U JP 2506080 U JP2506080 U JP 2506080U JP 2506080 U JP2506080 U JP 2506080U JP S56128556 U JPS56128556 U JP S56128556U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2506080U
Other languages
Japanese (ja)
Other versions
JPS6335395Y2 (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1980025060U priority Critical patent/JPS6335395Y2/ja
Publication of JPS56128556U publication Critical patent/JPS56128556U/ja
Application granted granted Critical
Publication of JPS6335395Y2 publication Critical patent/JPS6335395Y2/ja
Expired legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)
JP1980025060U 1980-02-29 1980-02-29 Expired JPS6335395Y2 (en:Method)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1980025060U JPS6335395Y2 (en:Method) 1980-02-29 1980-02-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1980025060U JPS6335395Y2 (en:Method) 1980-02-29 1980-02-29

Publications (2)

Publication Number Publication Date
JPS56128556U true JPS56128556U (en:Method) 1981-09-30
JPS6335395Y2 JPS6335395Y2 (en:Method) 1988-09-20

Family

ID=29621122

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1980025060U Expired JPS6335395Y2 (en:Method) 1980-02-29 1980-02-29

Country Status (1)

Country Link
JP (1) JPS6335395Y2 (en:Method)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6156940A (ja) * 1984-07-31 1986-03-22 Hitachi Ltd 液中の不純物を測定する方法とその装置
JPS6214036A (ja) * 1985-07-12 1987-01-22 Rion Co Ltd 光散乱式粒子計数器
JP2007199012A (ja) * 2006-01-30 2007-08-09 Nidec Sankyo Corp 光散乱式粒子計数装置
JP2017026545A (ja) * 2015-07-27 2017-02-02 パナソニックIpマネジメント株式会社 粒子検出センサ
WO2017104533A1 (ja) * 2015-12-14 2017-06-22 三菱電機株式会社 微小物検出装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015151502A1 (ja) * 2014-04-03 2015-10-08 パナソニックIpマネジメント株式会社 粒子検出センサ、ダストセンサ、煙感知器、空気清浄機、換気扇及びエアコン

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4915488A (en:Method) * 1972-05-19 1974-02-09

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4915488A (en:Method) * 1972-05-19 1974-02-09

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6156940A (ja) * 1984-07-31 1986-03-22 Hitachi Ltd 液中の不純物を測定する方法とその装置
JPS6214036A (ja) * 1985-07-12 1987-01-22 Rion Co Ltd 光散乱式粒子計数器
JP2007199012A (ja) * 2006-01-30 2007-08-09 Nidec Sankyo Corp 光散乱式粒子計数装置
JP2017026545A (ja) * 2015-07-27 2017-02-02 パナソニックIpマネジメント株式会社 粒子検出センサ
CN106404618A (zh) * 2015-07-27 2017-02-15 松下知识产权经营株式会社 粒子检测传感器
WO2017104533A1 (ja) * 2015-12-14 2017-06-22 三菱電機株式会社 微小物検出装置

Also Published As

Publication number Publication date
JPS6335395Y2 (en:Method) 1988-09-20

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