JPS56119845A - Multifrequency eddy current defectoscope - Google Patents

Multifrequency eddy current defectoscope

Info

Publication number
JPS56119845A
JPS56119845A JP2292380A JP2292380A JPS56119845A JP S56119845 A JPS56119845 A JP S56119845A JP 2292380 A JP2292380 A JP 2292380A JP 2292380 A JP2292380 A JP 2292380A JP S56119845 A JPS56119845 A JP S56119845A
Authority
JP
Japan
Prior art keywords
flaw detection
signal
time
defectoscope
eddy current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2292380A
Other languages
Japanese (ja)
Inventor
Takashi Endo
Masatoshi Nishihara
Takeo Kamimura
Yasuo Araki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP2292380A priority Critical patent/JPS56119845A/en
Publication of JPS56119845A publication Critical patent/JPS56119845A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To make it possible to simultaneously observe plural signal patterns differing in flaw detection frequency, by time-dividing a multiple parallel output signal of respective flaw detection frequencies outputted by a probe and in the same time by selecting a desired flaw detection frequency. CONSTITUTION:While multifrequency eddy current defectoscope 8 operates and probe 1 moves in the direction shown by arrow 6 to detect structure 3 of outside of thin pipe 2 and defect 4 of thin pipe 2, the output of defectoscope 8 is inputted to signal display device 13. Respective flaw detection frequency signals are inputted to switch circuits 37-44 via impedance converting circuits 29-36 and time-divided, and then they are applied to the input terminals for X- and Y-axial deflection of recorder 9 via impedance converting circuits 49 and 50. To display only an optional flaw detection signal pattern, the brightness of a spot is made zero by the time width with which a flaw detection signal of a frequency undesired to display draws a pattern. Thus, the necessary number of signal recorders can be decreased.
JP2292380A 1980-02-26 1980-02-26 Multifrequency eddy current defectoscope Pending JPS56119845A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2292380A JPS56119845A (en) 1980-02-26 1980-02-26 Multifrequency eddy current defectoscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2292380A JPS56119845A (en) 1980-02-26 1980-02-26 Multifrequency eddy current defectoscope

Publications (1)

Publication Number Publication Date
JPS56119845A true JPS56119845A (en) 1981-09-19

Family

ID=12096155

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2292380A Pending JPS56119845A (en) 1980-02-26 1980-02-26 Multifrequency eddy current defectoscope

Country Status (1)

Country Link
JP (1) JPS56119845A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59108955A (en) * 1982-12-13 1984-06-23 Nippon Steel Corp Multiprobe-coil multifrequency eddy current type flaw detector
JPS59166857A (en) * 1983-03-11 1984-09-20 Nippon Steel Corp Signal processing circuit of multi-probe and multi-frequency eddy current test equipment
JPS62220869A (en) * 1986-03-17 1987-09-29 テクトロニツクス・インコ−ポレイテツド Signal display unit
JP2006250935A (en) * 2005-03-09 2006-09-21 General Electric Co <Ge> Inspection method and system using multifrequency phase analysis

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59108955A (en) * 1982-12-13 1984-06-23 Nippon Steel Corp Multiprobe-coil multifrequency eddy current type flaw detector
JPH0441300B2 (en) * 1982-12-13 1992-07-07 Nippon Steel Corp
JPS59166857A (en) * 1983-03-11 1984-09-20 Nippon Steel Corp Signal processing circuit of multi-probe and multi-frequency eddy current test equipment
JPH0441302B2 (en) * 1983-03-11 1992-07-07 Nippon Steel Corp
JPS62220869A (en) * 1986-03-17 1987-09-29 テクトロニツクス・インコ−ポレイテツド Signal display unit
JPH0547072B2 (en) * 1986-03-17 1993-07-15 Tektronix Inc
JP2006250935A (en) * 2005-03-09 2006-09-21 General Electric Co <Ge> Inspection method and system using multifrequency phase analysis

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