JPS56118251A - Blanking device in electro-optical system - Google Patents
Blanking device in electro-optical systemInfo
- Publication number
- JPS56118251A JPS56118251A JP2063880A JP2063880A JPS56118251A JP S56118251 A JPS56118251 A JP S56118251A JP 2063880 A JP2063880 A JP 2063880A JP 2063880 A JP2063880 A JP 2063880A JP S56118251 A JPS56118251 A JP S56118251A
- Authority
- JP
- Japan
- Prior art keywords
- blanking
- mirror body
- guard
- board
- wire
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000000903 blocking effect Effects 0.000 abstract 1
- 238000010894 electron beam technology Methods 0.000 abstract 1
- 239000012212 insulator Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Abstract
PURPOSE:To obtain an electron beam describing device which can draw a figure with high accuracy, by providing a shield guard on a blanking board thereby blocking the current flowing through a mirror body when the blanking voltage is changing. CONSTITUTION:A shield guard 19 is located between a mirror body 9 and a blanking board 4 and insulated through an insulator 11 from the blanking board 4, while connected through a guard wire 20 to the ground side of a blanking switch 15 to maintain the same potential with the mirror body 9. Consequently when the blanking switch 15 is switched from open to closed state to discharge the positive charge at the left side of the blanking board 4, the discharge current I2 of the stray capacitance C1' will not flow through the mirror body but through the guard wire 20, thereby it doesn't influence on the electron wire. Consequently good unblanking operation is performed resulting in a clear figure at the starting section with high accuracy.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55020638A JPS608581B2 (en) | 1980-02-22 | 1980-02-22 | Blanking device in electron optical system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55020638A JPS608581B2 (en) | 1980-02-22 | 1980-02-22 | Blanking device in electron optical system |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56118251A true JPS56118251A (en) | 1981-09-17 |
JPS608581B2 JPS608581B2 (en) | 1985-03-04 |
Family
ID=12032760
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55020638A Expired JPS608581B2 (en) | 1980-02-22 | 1980-02-22 | Blanking device in electron optical system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS608581B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63146334A (en) * | 1986-12-09 | 1988-06-18 | Jeol Ltd | Camera unit for electron microscope fitted with electron beam deflecting device |
JP2011165667A (en) * | 2010-02-12 | 2011-08-25 | Carl Zeiss Nts Gmbh | Particle beam system |
JP2016054291A (en) * | 2014-09-03 | 2016-04-14 | 株式会社ニューフレアテクノロジー | Blanking device for multiple charged particle beam, multiple charged particle beam drawing device, and defective beam interception method of multiple charged particle beam |
-
1980
- 1980-02-22 JP JP55020638A patent/JPS608581B2/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63146334A (en) * | 1986-12-09 | 1988-06-18 | Jeol Ltd | Camera unit for electron microscope fitted with electron beam deflecting device |
JP2011165667A (en) * | 2010-02-12 | 2011-08-25 | Carl Zeiss Nts Gmbh | Particle beam system |
EP2360712A3 (en) * | 2010-02-12 | 2017-01-04 | Carl Zeiss NTS GmbH | Particle beam system |
JP2016054291A (en) * | 2014-09-03 | 2016-04-14 | 株式会社ニューフレアテクノロジー | Blanking device for multiple charged particle beam, multiple charged particle beam drawing device, and defective beam interception method of multiple charged particle beam |
Also Published As
Publication number | Publication date |
---|---|
JPS608581B2 (en) | 1985-03-04 |
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