JPS56116185A - Pattern comparing method - Google Patents

Pattern comparing method

Info

Publication number
JPS56116185A
JPS56116185A JP1908080A JP1908080A JPS56116185A JP S56116185 A JPS56116185 A JP S56116185A JP 1908080 A JP1908080 A JP 1908080A JP 1908080 A JP1908080 A JP 1908080A JP S56116185 A JPS56116185 A JP S56116185A
Authority
JP
Japan
Prior art keywords
standard pattern
inspected
pattern
pattern data
stored
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1908080A
Other languages
Japanese (ja)
Inventor
Takeshi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Denshi KK
Original Assignee
Hitachi Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Denshi KK filed Critical Hitachi Denshi KK
Priority to JP1908080A priority Critical patent/JPS56116185A/en
Publication of JPS56116185A publication Critical patent/JPS56116185A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Abstract

PURPOSE:To avoid the inspection mistake within permissible range, by moving the standard pattern within predetermined range, producing the greater and smaller standard pattern than the standard pattern and comparing the standard pattern with the pattern to be inspected. CONSTITUTION:The pattern to be inspected 1 is set to the reference location with pulse motors 2, 3 and pickup is made by a camera 6. The signal obtained from the camera is stored in the internal memory 10. On the other hand, the standard pattern data is read out from the external memory 11 to the internal memory 10'. Next, the pattern data to be inspected stored in the content memory 10 and the standard pattern data stored in the internal memory 10' are in series or parallel compared. The pattern data to be inspected is judged good if it satisfies a condition to the two standard pattern data of logical sum and product.
JP1908080A 1980-02-20 1980-02-20 Pattern comparing method Pending JPS56116185A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1908080A JPS56116185A (en) 1980-02-20 1980-02-20 Pattern comparing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1908080A JPS56116185A (en) 1980-02-20 1980-02-20 Pattern comparing method

Publications (1)

Publication Number Publication Date
JPS56116185A true JPS56116185A (en) 1981-09-11

Family

ID=11989456

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1908080A Pending JPS56116185A (en) 1980-02-20 1980-02-20 Pattern comparing method

Country Status (1)

Country Link
JP (1) JPS56116185A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59165183A (en) * 1983-03-11 1984-09-18 Hitachi Denshi Ltd Pattern recognizing device
JPS59186073A (en) * 1983-04-06 1984-10-22 Ricoh Co Ltd Pattern comparing device
JPS59205680A (en) * 1983-05-09 1984-11-21 Ricoh Co Ltd Pattern comparator
JPS60200382A (en) * 1984-03-24 1985-10-09 Sumitomo Metal Ind Ltd Method and device for pattern checking
JPS6265183A (en) * 1985-09-17 1987-03-24 Shigumatsukusu Kk Identification device for object
JPH01229386A (en) * 1988-03-09 1989-09-13 Brother Ind Ltd Sample pattern generating device

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59165183A (en) * 1983-03-11 1984-09-18 Hitachi Denshi Ltd Pattern recognizing device
JPS59186073A (en) * 1983-04-06 1984-10-22 Ricoh Co Ltd Pattern comparing device
JPH0342480B2 (en) * 1983-04-06 1991-06-27
JPS59205680A (en) * 1983-05-09 1984-11-21 Ricoh Co Ltd Pattern comparator
JPH0554118B2 (en) * 1983-05-09 1993-08-11 Ricoh Kk
JPS60200382A (en) * 1984-03-24 1985-10-09 Sumitomo Metal Ind Ltd Method and device for pattern checking
JPS6265183A (en) * 1985-09-17 1987-03-24 Shigumatsukusu Kk Identification device for object
JPH01229386A (en) * 1988-03-09 1989-09-13 Brother Ind Ltd Sample pattern generating device

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