JPS5611377A - Exposure dose rate emission rate stack gas monitoring system - Google Patents
Exposure dose rate emission rate stack gas monitoring systemInfo
- Publication number
- JPS5611377A JPS5611377A JP8719179A JP8719179A JPS5611377A JP S5611377 A JPS5611377 A JP S5611377A JP 8719179 A JP8719179 A JP 8719179A JP 8719179 A JP8719179 A JP 8719179A JP S5611377 A JPS5611377 A JP S5611377A
- Authority
- JP
- Japan
- Prior art keywords
- rate
- exposure
- emission
- detector
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012544 monitoring process Methods 0.000 title 1
- 239000007789 gas Substances 0.000 abstract 3
- 238000005259 measurement Methods 0.000 abstract 3
- 230000002285 radioactive effect Effects 0.000 abstract 3
- 230000004907 flux Effects 0.000 abstract 1
- 230000005251 gamma ray Effects 0.000 abstract 1
- 239000000203 mixture Substances 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
- 239000002912 waste gas Substances 0.000 abstract 1
Landscapes
- Measurement Of Radiation (AREA)
Abstract
PURPOSE: To facilitate measurement of the exposure does rate on the leeward ground surface, by measuring the exposure does rate in a limited space in the emission source side to obtain a 4π exposure does rate emission rate and average energy of radioactive rare gas.
CONSTITUTION: Radioactive rate gas generated from unclear reactor building 1 is exhausted to the environment from stack 2, and the exhaust rate of the stack is measured continuously by measuring equipment 3. A part of waste gas is flowed continuously to limited space 9 by pump 4, and detector 10 for exposure does rate measurement and detector 11 for γ-ray flux measurement are inserted to space 9. Detectors 10 and 11 are connected to differential amplifier 14 through logarithmic does indicator 12 and lograte meter 13 respectively. By this constitution, the exposure does rate on the leeward ground surface can be obtained easily by using the 4π radiation dose rate emission rate calculated from the exposure dose rate measured by detector 10 and average energy of nuclid mixture radioactive rare gas obtained from differential amplifier 14.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8719179A JPS5611377A (en) | 1979-07-10 | 1979-07-10 | Exposure dose rate emission rate stack gas monitoring system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8719179A JPS5611377A (en) | 1979-07-10 | 1979-07-10 | Exposure dose rate emission rate stack gas monitoring system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5611377A true JPS5611377A (en) | 1981-02-04 |
| JPS6111383B2 JPS6111383B2 (en) | 1986-04-02 |
Family
ID=13908090
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8719179A Granted JPS5611377A (en) | 1979-07-10 | 1979-07-10 | Exposure dose rate emission rate stack gas monitoring system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5611377A (en) |
-
1979
- 1979-07-10 JP JP8719179A patent/JPS5611377A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6111383B2 (en) | 1986-04-02 |
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