JPS56108941A - Automatic rate analyzing method - Google Patents
Automatic rate analyzing methodInfo
- Publication number
- JPS56108941A JPS56108941A JP1005280A JP1005280A JPS56108941A JP S56108941 A JPS56108941 A JP S56108941A JP 1005280 A JP1005280 A JP 1005280A JP 1005280 A JP1005280 A JP 1005280A JP S56108941 A JPS56108941 A JP S56108941A
- Authority
- JP
- Japan
- Prior art keywords
- absorbance
- concn
- converter
- measured
- threshold
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/272—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration for following a reaction, e.g. for determining photometrically a reaction rate (photometric cinetic analysis)
Abstract
PURPOSE:To make possible the decrease in analytical errors by obtaining the detection threshold for each individual specimen in a rate analyzing method for specimens using an automatic analytical apparatus. CONSTITUTION:Transmitted light is divided by a diffraction grating 3, and a measuring wavelength is screened therefrom. The absorbance changing amount thereof is measured with a integrator 9 of absorbance change amount by way of a detector 4, a multiplexer 5 and an AD converter 6. Thence, the result including end point absorbance is sent to a concn. converter 11, whereby the concn. of the material to be measured is obtained. The photometric signal is sent from the AD converter 6 to a multiwavelength analyzer 9, by which it is analyzed and true threshold absorbance is obtained. The comparison of said threshold absorbance and the previous end point absorbance and the checking of a steady state are accomplished by a steay state deciding device 10, and if the result of the decision is good, the concn. of the material to be measured is outputted from a printer 12 for output and, conversely, if it is defective, the effect that it is an abnormally highly active specimen is outputted therefrom.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1005280A JPS56108941A (en) | 1980-02-01 | 1980-02-01 | Automatic rate analyzing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1005280A JPS56108941A (en) | 1980-02-01 | 1980-02-01 | Automatic rate analyzing method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56108941A true JPS56108941A (en) | 1981-08-28 |
Family
ID=11739618
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1005280A Pending JPS56108941A (en) | 1980-02-01 | 1980-02-01 | Automatic rate analyzing method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56108941A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59116549A (en) * | 1982-11-30 | 1984-07-05 | 日本テクトロン株式会社 | Method and apparatus for monitoring analysis data for automatic analyzer |
JPS63271140A (en) * | 1987-04-28 | 1988-11-09 | Shimadzu Corp | Automatic rate analyzing method |
-
1980
- 1980-02-01 JP JP1005280A patent/JPS56108941A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59116549A (en) * | 1982-11-30 | 1984-07-05 | 日本テクトロン株式会社 | Method and apparatus for monitoring analysis data for automatic analyzer |
JPH0534626B2 (en) * | 1982-11-30 | 1993-05-24 | Orinpasu Kogaku Kogyo Kk | |
JPS63271140A (en) * | 1987-04-28 | 1988-11-09 | Shimadzu Corp | Automatic rate analyzing method |
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