JPS56103360A - Radiation fluoroscopic inspecting apparatus - Google Patents

Radiation fluoroscopic inspecting apparatus

Info

Publication number
JPS56103360A
JPS56103360A JP448280A JP448280A JPS56103360A JP S56103360 A JPS56103360 A JP S56103360A JP 448280 A JP448280 A JP 448280A JP 448280 A JP448280 A JP 448280A JP S56103360 A JPS56103360 A JP S56103360A
Authority
JP
Japan
Prior art keywords
sample
detector
exchange port
detection signal
fluoroscopic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP448280A
Other languages
Japanese (ja)
Inventor
Tetsuo Sakamoto
Masaji Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Nissan Motor Co Ltd
Original Assignee
Toshiba Corp
Nissan Motor Co Ltd
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Nissan Motor Co Ltd, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP448280A priority Critical patent/JPS56103360A/en
Publication of JPS56103360A publication Critical patent/JPS56103360A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To improve space factor by providing a sample detector which confirms the presence of a sample in a sample exchange port. CONSTITUTION:A sample exchange port 16 is formed to an apparatus body 10, and a sample detector consisting of a light projector 17 and a photodetector 18 is provided near this exchange port 16 in a manner as to sandwich a sample table 12. A position detector 15 outputs the detection signal when a sample setting part positions in an X-ray inspecting part. Based on this detection signal and the signal from the sample detector, it is confirmed that the sample exists in the predetermined position, then a radiation shield shutter 23 is opened and radiations are irradiated to the sample 11. The fluoroscopic X-ray image of the sample 11 is stored in a memory 27 and is displayed in a monitor 26.
JP448280A 1980-01-21 1980-01-21 Radiation fluoroscopic inspecting apparatus Pending JPS56103360A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP448280A JPS56103360A (en) 1980-01-21 1980-01-21 Radiation fluoroscopic inspecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP448280A JPS56103360A (en) 1980-01-21 1980-01-21 Radiation fluoroscopic inspecting apparatus

Publications (1)

Publication Number Publication Date
JPS56103360A true JPS56103360A (en) 1981-08-18

Family

ID=11585314

Family Applications (1)

Application Number Title Priority Date Filing Date
JP448280A Pending JPS56103360A (en) 1980-01-21 1980-01-21 Radiation fluoroscopic inspecting apparatus

Country Status (1)

Country Link
JP (1) JPS56103360A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS484071U (en) * 1971-05-24 1973-01-18

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS484071U (en) * 1971-05-24 1973-01-18

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