JPS56102477U - - Google Patents
Info
- Publication number
- JPS56102477U JPS56102477U JP16355579U JP16355579U JPS56102477U JP S56102477 U JPS56102477 U JP S56102477U JP 16355579 U JP16355579 U JP 16355579U JP 16355579 U JP16355579 U JP 16355579U JP S56102477 U JPS56102477 U JP S56102477U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16355579U JPS622541Y2 (en:Method) | 1979-11-28 | 1979-11-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16355579U JPS622541Y2 (en:Method) | 1979-11-28 | 1979-11-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56102477U true JPS56102477U (en:Method) | 1981-08-11 |
| JPS622541Y2 JPS622541Y2 (en:Method) | 1987-01-21 |
Family
ID=29674522
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16355579U Expired JPS622541Y2 (en:Method) | 1979-11-28 | 1979-11-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS622541Y2 (en:Method) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008102035A (ja) * | 2006-10-19 | 2008-05-01 | Hioki Ee Corp | クランプテスタ |
| JP2011117837A (ja) * | 2009-12-03 | 2011-06-16 | Hioki Ee Corp | クランプセンサ |
| JP2022167078A (ja) * | 2021-04-22 | 2022-11-04 | 日置電機株式会社 | クランプセンサおよび測定装置 |
-
1979
- 1979-11-28 JP JP16355579U patent/JPS622541Y2/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008102035A (ja) * | 2006-10-19 | 2008-05-01 | Hioki Ee Corp | クランプテスタ |
| JP2011117837A (ja) * | 2009-12-03 | 2011-06-16 | Hioki Ee Corp | クランプセンサ |
| JP2022167078A (ja) * | 2021-04-22 | 2022-11-04 | 日置電機株式会社 | クランプセンサおよび測定装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS622541Y2 (en:Method) | 1987-01-21 |