JPS5599050A - Xxray spectroscope - Google Patents
Xxray spectroscopeInfo
- Publication number
- JPS5599050A JPS5599050A JP663679A JP663679A JPS5599050A JP S5599050 A JPS5599050 A JP S5599050A JP 663679 A JP663679 A JP 663679A JP 663679 A JP663679 A JP 663679A JP S5599050 A JPS5599050 A JP S5599050A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- crystals
- arm
- spectroscope
- point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP663679A JPS5599050A (en) | 1979-01-23 | 1979-01-23 | Xxray spectroscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP663679A JPS5599050A (en) | 1979-01-23 | 1979-01-23 | Xxray spectroscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5599050A true JPS5599050A (en) | 1980-07-28 |
JPS636830B2 JPS636830B2 (ja) | 1988-02-12 |
Family
ID=11643846
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP663679A Granted JPS5599050A (en) | 1979-01-23 | 1979-01-23 | Xxray spectroscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5599050A (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59108945A (ja) * | 1982-11-25 | 1984-06-23 | エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン | X線回析装置 |
JP2006337290A (ja) * | 2005-06-06 | 2006-12-14 | Shimadzu Corp | X線分光装置 |
JP2006337122A (ja) * | 2005-06-01 | 2006-12-14 | Shimadzu Corp | X線分光装置 |
-
1979
- 1979-01-23 JP JP663679A patent/JPS5599050A/ja active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59108945A (ja) * | 1982-11-25 | 1984-06-23 | エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン | X線回析装置 |
JPH0430541B2 (ja) * | 1982-11-25 | 1992-05-22 | ||
JP2006337122A (ja) * | 2005-06-01 | 2006-12-14 | Shimadzu Corp | X線分光装置 |
JP2006337290A (ja) * | 2005-06-06 | 2006-12-14 | Shimadzu Corp | X線分光装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS636830B2 (ja) | 1988-02-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS60207018A (ja) | モノクロメ−タ | |
Katon et al. | The vibrational spectra and molecular configuration of diphenyl ether | |
JPS5599050A (en) | Xxray spectroscope | |
IL41592A (en) | X-ray spectrodiffractometer | |
GB1219647A (en) | Arrangement for use in a fully focussing x-ray spectro meter | |
JPS56101578A (en) | Radiation type tomography device | |
SE7902405L (sv) | Instellningsmekanism | |
FR2308839A1 (fr) | Dispositif d'entrainement de soupapes en rotation | |
GB1020930A (en) | Improvements relating to x-ray analysing apparatus | |
US2421344A (en) | Colorimeter | |
GB1293819A (en) | An x-ray diffraction apparatus | |
CA959288A (en) | Sampling technique for atomic absorption spectroscopy | |
JPS547391A (en) | Detecting probe protecting mechanism of rotary type flaw detecting apparatus | |
GB1386776A (en) | Microtomes | |
GB1413417A (en) | Optical apparatus | |
JPS56166434A (en) | Chopper for spectrophotometer | |
SU871117A2 (ru) | Юстировочный прибор | |
SU672757A1 (ru) | Устройство дл гор чей навивки пружин | |
SU594226A1 (ru) | Устройство дл перемещени сшиваемых деталей на швейном полуавтомате | |
Li et al. | Effect of Y exp 3+ Ion Concentration on the Stability of YSCZ Single Crystal | |
JPS56165139A (en) | Curved section x-ray tomographic device | |
NL7504876A (en) | Precession X-ray diffraction camera - has modified mechanical design to permit greater versatility in use with single mounting of crystal | |
SU1528672A1 (ru) | Прибор дл воспроизведени кривых | |
SCHILIZZI et al. | Observations with a VLB array. III- The sources 3 C 120, 3 C 273 B, 2134+ 004, and 3 C 84(quasars and Seyfert galaxies) | |
SU800645A1 (ru) | Лентопрот жный механизм |