JPS5588168U - - Google Patents
Info
- Publication number
- JPS5588168U JPS5588168U JP1979167491U JP16749179U JPS5588168U JP S5588168 U JPS5588168 U JP S5588168U JP 1979167491 U JP1979167491 U JP 1979167491U JP 16749179 U JP16749179 U JP 16749179U JP S5588168 U JPS5588168 U JP S5588168U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US477711A US3893027A (en) | 1974-06-10 | 1974-06-10 | Electrical test probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5588168U true JPS5588168U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1980-06-18 |
| JPS5634306Y2 JPS5634306Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1981-08-13 |
Family
ID=23897040
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50069458A Pending JPS518975A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1974-06-10 | 1975-06-09 | |
| JP1979167491U Expired JPS5634306Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1974-06-10 | 1979-12-03 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50069458A Pending JPS518975A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1974-06-10 | 1975-06-09 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US3893027A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
| JP (2) | JPS518975A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD257239S (en) | 1978-05-10 | 1980-10-07 | The Superior Electric Company | Electrical test probe |
| US4401237A (en) * | 1981-01-15 | 1983-08-30 | Bethlehem Steel Corporation | Apparatus for monitoring feed of granular material |
| JPS6049594B2 (ja) * | 1981-06-29 | 1985-11-02 | 橋本フオ−ミング工業株式会社 | 装飾性成形品 |
| US4646002A (en) * | 1984-05-10 | 1987-02-24 | Regents Of The University Of Minnesota | Circuit for high impedance broad band probe |
| JP2676388B2 (ja) * | 1988-10-12 | 1997-11-12 | 大日精化工業株式会社 | 艶消し塗料組成物 |
| US4891586A (en) * | 1989-02-13 | 1990-01-02 | Tektronix, Inc. | IC grabber probe |
| US5457392A (en) * | 1990-12-20 | 1995-10-10 | Filipescu; Radu | Testing clip and circuit board contacting method |
| US5416405A (en) * | 1993-08-02 | 1995-05-16 | Dill; David M. | Test probe with improved capture assembly and threaded needle point probe adjustment |
| US5484306A (en) * | 1994-10-20 | 1996-01-16 | Interconnect Devices Inc. | Quick-connect terminal and receptacle |
| DE102005061231B4 (de) * | 2005-12-20 | 2020-04-09 | Huf Hülsbeck & Fürst Gmbh & Co. Kg | Zylinderkern |
| US7135851B1 (en) | 2006-04-18 | 2006-11-14 | Armstrong Eric A | Terminal block probe and probe kit |
| US8154316B2 (en) * | 2008-12-11 | 2012-04-10 | Fluke Corporation | Method and apparatus for indexing an adjustable test probe tip |
| US7902848B2 (en) * | 2009-01-09 | 2011-03-08 | Fluke Corporation | Reversible test probe and test probe tip |
| US7880487B2 (en) * | 2009-01-22 | 2011-02-01 | Fluke Corporation | Test lead probe with retractable insulative sleeve |
| US20110043191A1 (en) * | 2009-03-10 | 2011-02-24 | Fidel Gutierrez | Phoenix probe X voltage tester |
| FR2947633B1 (fr) * | 2009-07-02 | 2012-04-13 | Snecma | Dispositif de controle non destructif d'une piece |
| CN102004173B (zh) * | 2009-09-01 | 2014-02-19 | 鸿富锦精密工业（深圳）有限公司 | 探针 |
| US20130328549A1 (en) * | 2012-06-07 | 2013-12-12 | Chung Instrument Electronics Industrial Co., Ltd. | Rotating mobile probe and probing rod using the same |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4843674U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1971-09-22 | 1973-06-06 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2668516A (en) * | 1947-09-09 | 1954-02-09 | Jovanovitsch Predrag | Writing device |
| JPS4843673B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1969-02-17 | 1973-12-20 | ||
| JPS4843674B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1969-02-26 | 1973-12-20 |
-
1974
- 1974-06-10 US US477711A patent/US3893027A/en not_active Expired - Lifetime
-
1975
- 1975-06-09 JP JP50069458A patent/JPS518975A/ja active Pending
-
1979
- 1979-12-03 JP JP1979167491U patent/JPS5634306Y2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4843674U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1971-09-22 | 1973-06-06 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS518975A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1976-01-24 |
| JPS5634306Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1981-08-13 |
| US3893027A (en) | 1975-07-01 |