JPS557656B2 - - Google Patents

Info

Publication number
JPS557656B2
JPS557656B2 JP7148972A JP7148972A JPS557656B2 JP S557656 B2 JPS557656 B2 JP S557656B2 JP 7148972 A JP7148972 A JP 7148972A JP 7148972 A JP7148972 A JP 7148972A JP S557656 B2 JPS557656 B2 JP S557656B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7148972A
Other languages
Japanese (ja)
Other versions
JPS4929766A (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7148972A priority Critical patent/JPS557656B2/ja
Priority to US377932A priority patent/US3887839A/en
Priority to GB3291873A priority patent/GB1431069A/en
Priority to FR7326053A priority patent/FR2193248B1/fr
Priority to DE19732336155 priority patent/DE2336155C3/de
Publication of JPS4929766A publication Critical patent/JPS4929766A/ja
Publication of JPS557656B2 publication Critical patent/JPS557656B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
    • H01J3/02—Electron guns
    • H01J3/021—Electron guns using a field emission, photo emission, or secondary emission electron source

Landscapes

  • Electron Sources, Ion Sources (AREA)
  • Cold Cathode And The Manufacture (AREA)
JP7148972A 1972-07-17 1972-07-17 Expired JPS557656B2 (enrdf_load_stackoverflow)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP7148972A JPS557656B2 (enrdf_load_stackoverflow) 1972-07-17 1972-07-17
US377932A US3887839A (en) 1972-07-17 1973-07-10 Pulsed field emission type electron gun
GB3291873A GB1431069A (en) 1972-07-17 1973-07-10 Pulsed field emission electron gun apparatus
FR7326053A FR2193248B1 (enrdf_load_stackoverflow) 1972-07-17 1973-07-16
DE19732336155 DE2336155C3 (de) 1972-07-17 1973-07-16 Verfahren zum Betrieb einer FeIdemmissioiiselektronenquelle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7148972A JPS557656B2 (enrdf_load_stackoverflow) 1972-07-17 1972-07-17

Publications (2)

Publication Number Publication Date
JPS4929766A JPS4929766A (enrdf_load_stackoverflow) 1974-03-16
JPS557656B2 true JPS557656B2 (enrdf_load_stackoverflow) 1980-02-27

Family

ID=13462110

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7148972A Expired JPS557656B2 (enrdf_load_stackoverflow) 1972-07-17 1972-07-17

Country Status (4)

Country Link
US (1) US3887839A (enrdf_load_stackoverflow)
JP (1) JPS557656B2 (enrdf_load_stackoverflow)
FR (1) FR2193248B1 (enrdf_load_stackoverflow)
GB (1) GB1431069A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5818101A (ja) * 1981-07-27 1983-02-02 Nippon Denzai Kogyo Kenkyusho:Kk タツチセンサ−
JPS6440219A (en) * 1987-08-04 1989-02-10 Fanuc Ltd Machining start hole measuring device

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4337422A (en) * 1980-03-17 1982-06-29 The Perkin-Elmer Corporation Field emission gun with noise compensation
US5025196A (en) * 1986-06-02 1991-06-18 Canon Kabushiki Kaisha Image forming device with beam current control
JP3131339B2 (ja) * 1993-12-22 2001-01-31 三菱電機株式会社 陰極、陰極線管および陰極線管の作動方法
JPH08212952A (ja) * 1995-02-06 1996-08-20 Natl Res Inst For Metals レーザー照射型電子銃
EP1426997A1 (en) * 2002-12-06 2004-06-09 ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik Mbh Field emitter beam source and method for controlling a beam current
USD522376S1 (en) 2004-02-02 2006-06-06 Societe Des Produits Nestle S.A. Leaf shaped box
EP1760761B1 (en) * 2005-09-05 2017-10-18 ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Charged particle beam emitting device and method for operating a charged particle beam emitting device
EP2365511B1 (en) * 2010-03-10 2013-05-08 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Feedback loop for emitter flash cleaning
US8487534B2 (en) * 2010-03-31 2013-07-16 General Electric Company Pierce gun and method of controlling thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE878685C (de) * 1951-03-28 1953-06-05 Wilhelm Dipl-Chem Dr Stuermer Verfahren zur Abbildung von Objekten mit dem Feldemissionsmikroskop
US3361928A (en) * 1962-11-28 1968-01-02 Hitachi Ltd Transformers having a plurality of secondary windings and charged particle sources of double pulsing system utilizing such transformers
US3775637A (en) * 1971-09-15 1973-11-27 Rca Corp Cathode ray display intensity control circuit
US3786305A (en) * 1972-05-15 1974-01-15 Hitachi Ltd Field emission electron gun
US3794878A (en) * 1972-12-11 1974-02-26 Ford Motor Co Electron beam regulator

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5818101A (ja) * 1981-07-27 1983-02-02 Nippon Denzai Kogyo Kenkyusho:Kk タツチセンサ−
JPS6440219A (en) * 1987-08-04 1989-02-10 Fanuc Ltd Machining start hole measuring device

Also Published As

Publication number Publication date
DE2336155B2 (de) 1975-10-16
FR2193248A1 (enrdf_load_stackoverflow) 1974-02-15
JPS4929766A (enrdf_load_stackoverflow) 1974-03-16
GB1431069A (en) 1976-04-07
US3887839A (en) 1975-06-03
DE2336155A1 (de) 1974-02-07
FR2193248B1 (enrdf_load_stackoverflow) 1977-02-18

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