JPS5574480A - Semiconductor x-ray detector for use in x-ray exposure control device - Google Patents

Semiconductor x-ray detector for use in x-ray exposure control device

Info

Publication number
JPS5574480A
JPS5574480A JP14825678A JP14825678A JPS5574480A JP S5574480 A JPS5574480 A JP S5574480A JP 14825678 A JP14825678 A JP 14825678A JP 14825678 A JP14825678 A JP 14825678A JP S5574480 A JPS5574480 A JP S5574480A
Authority
JP
Japan
Prior art keywords
ray
thickness
detecting element
mount base
ray detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14825678A
Other languages
Japanese (ja)
Other versions
JPS5762028B2 (en
Inventor
Yujiro Naruse
Toru Sugita
Tetsuji Kozai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP14825678A priority Critical patent/JPS5574480A/en
Publication of JPS5574480A publication Critical patent/JPS5574480A/en
Publication of JPS5762028B2 publication Critical patent/JPS5762028B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Light Receiving Elements (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)

Abstract

PURPOSE: To prevent the shadow of the detector itself from appearing on the subsequent films by constituting specifically the thickness of an X-ray detecting element, the thickness of an electrode lead-out wire and the configuration of a mount base.
CONSTITUTION: A semiconductor X-ray detecting element 41, is mounted on a mount base 44 formed in a substantially ring shape, and an electrode is fitted to cover its rear back surface. The X-ray detecting element 41 which is unitarily mounted on the mount base 44 is fitted and fixed in a hole formed in the stationary plate 42, and electrode lead out wires 431 and 432 are arranged. The thickness of the X-ray detecting element 41 is converted into 100W800μm in the terms of aluminum relating to the X-ray damping and electrode lead out wires 431 and 432 are formed by an aluminum film of 40μm or less of thickness. Furthermore, the outer peripheral part of the mount base 44, that is, the fitting part with the stationary plate 42 and its inner peripheral part thereof are tapered.
COPYRIGHT: (C)1980,JPO&Japio
JP14825678A 1978-11-30 1978-11-30 Semiconductor x-ray detector for use in x-ray exposure control device Granted JPS5574480A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14825678A JPS5574480A (en) 1978-11-30 1978-11-30 Semiconductor x-ray detector for use in x-ray exposure control device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14825678A JPS5574480A (en) 1978-11-30 1978-11-30 Semiconductor x-ray detector for use in x-ray exposure control device

Publications (2)

Publication Number Publication Date
JPS5574480A true JPS5574480A (en) 1980-06-05
JPS5762028B2 JPS5762028B2 (en) 1982-12-27

Family

ID=15448706

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14825678A Granted JPS5574480A (en) 1978-11-30 1978-11-30 Semiconductor x-ray detector for use in x-ray exposure control device

Country Status (1)

Country Link
JP (1) JPS5574480A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4403150A (en) * 1980-02-27 1983-09-06 Tokyo Shibaura Denki Kabushiki Kaisha Semiconductor radiation sensor arrangement for an automatic X-ray exposure control apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4403150A (en) * 1980-02-27 1983-09-06 Tokyo Shibaura Denki Kabushiki Kaisha Semiconductor radiation sensor arrangement for an automatic X-ray exposure control apparatus

Also Published As

Publication number Publication date
JPS5762028B2 (en) 1982-12-27

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