JPS5574410A - Measurement of semiconductor device - Google Patents

Measurement of semiconductor device

Info

Publication number
JPS5574410A
JPS5574410A JP14711078A JP14711078A JPS5574410A JP S5574410 A JPS5574410 A JP S5574410A JP 14711078 A JP14711078 A JP 14711078A JP 14711078 A JP14711078 A JP 14711078A JP S5574410 A JPS5574410 A JP S5574410A
Authority
JP
Japan
Prior art keywords
base
tip end
measurement
contactor
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14711078A
Other languages
Japanese (ja)
Inventor
Masaru Nemoto
Yoshiaki Sano
Kazuya Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP14711078A priority Critical patent/JPS5574410A/en
Publication of JPS5574410A publication Critical patent/JPS5574410A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To measure a bend of the semiconductor base by means of a measuring tool located between two contactors by forming the contactor with a very thin and long shaped tip end, which can cross the fitting hole of the base, and by making the tips of contactors contact with the holes of base.
CONSTITUTION: The tip end 7 of contactor 2' that is in a body with the jig proper 3 is made very thin and long shaped so that it can cross the fitting hole 6 of the semiconductor base 1, the tip end is made contact with the hole of base, and the dial gauge is read.
COPYRIGHT: (C)1980,JPO&Japio
JP14711078A 1978-11-30 1978-11-30 Measurement of semiconductor device Pending JPS5574410A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14711078A JPS5574410A (en) 1978-11-30 1978-11-30 Measurement of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14711078A JPS5574410A (en) 1978-11-30 1978-11-30 Measurement of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5574410A true JPS5574410A (en) 1980-06-05

Family

ID=15422737

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14711078A Pending JPS5574410A (en) 1978-11-30 1978-11-30 Measurement of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5574410A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5033661B1 (en) * 1969-06-09 1975-11-01
JPS52105854A (en) * 1976-03-03 1977-09-05 Hitachi Ltd Device for measuring wear of rope groove

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5033661B1 (en) * 1969-06-09 1975-11-01
JPS52105854A (en) * 1976-03-03 1977-09-05 Hitachi Ltd Device for measuring wear of rope groove

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