JPS555049B2 - - Google Patents
Info
- Publication number
- JPS555049B2 JPS555049B2 JP9546175A JP9546175A JPS555049B2 JP S555049 B2 JPS555049 B2 JP S555049B2 JP 9546175 A JP9546175 A JP 9546175A JP 9546175 A JP9546175 A JP 9546175A JP S555049 B2 JPS555049 B2 JP S555049B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M17/00—Testing of vehicles
- G01M17/007—Wheeled or endless-tracked vehicles
- G01M17/02—Tyres
- G01M17/028—Tyres using X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
- G01N23/185—Investigating the presence of flaws defects or foreign matter in tyres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/627—Specific applications or type of materials tyres
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US49537674A | 1974-08-07 | 1974-08-07 | |
US05/495,448 US3969627A (en) | 1974-08-07 | 1974-08-07 | System of positioning and inspecting tires |
US05/495,377 US4088936A (en) | 1974-08-07 | 1974-08-07 | Tire inspection system |
US05/495,447 US3944831A (en) | 1974-08-07 | 1974-08-07 | Tire inspection system with shielded X-ray source |
US05/495,493 US3987672A (en) | 1974-08-07 | 1974-08-07 | Tire inspection system |
US05/495,379 US3952195A (en) | 1974-08-07 | 1974-08-07 | System of inspecting tires with relatively movable inspection apparatus components |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5141586A JPS5141586A (zh) | 1976-04-07 |
JPS555049B2 true JPS555049B2 (zh) | 1980-02-04 |
Family
ID=27560067
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9546175A Expired JPS555049B2 (zh) | 1974-08-07 | 1975-08-07 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS555049B2 (zh) |
DE (1) | DE2535145C3 (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3952195A (en) * | 1974-08-07 | 1976-04-20 | Picker Corporation | System of inspecting tires with relatively movable inspection apparatus components |
US6016695A (en) * | 1997-01-24 | 2000-01-25 | Illinois Tool Works Inc. | Tire uniformity testing system |
DE102006045283A1 (de) * | 2006-09-22 | 2008-04-10 | Carl Zeiss 3D Automation Gmbh | Vorbereitungsanordnung für bildgebende Meßvorrichtungen |
DE102008037356C5 (de) * | 2008-08-12 | 2020-09-17 | Bernward Mähner | Stapelmodul und Zentriermodul für eine Prüfanlage zum Prüfen von Reifen |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4968789A (zh) * | 1972-09-01 | 1974-07-03 |
-
1975
- 1975-08-06 DE DE2535145A patent/DE2535145C3/de not_active Expired
- 1975-08-07 JP JP9546175A patent/JPS555049B2/ja not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4968789A (zh) * | 1972-09-01 | 1974-07-03 |
Also Published As
Publication number | Publication date |
---|---|
DE2535145C3 (de) | 1980-10-23 |
JPS5141586A (zh) | 1976-04-07 |
DE2535145B2 (de) | 1980-02-28 |
DE2535145A1 (de) | 1976-02-26 |