JPS555049B2 - - Google Patents

Info

Publication number
JPS555049B2
JPS555049B2 JP9546175A JP9546175A JPS555049B2 JP S555049 B2 JPS555049 B2 JP S555049B2 JP 9546175 A JP9546175 A JP 9546175A JP 9546175 A JP9546175 A JP 9546175A JP S555049 B2 JPS555049 B2 JP S555049B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9546175A
Other languages
Japanese (ja)
Other versions
JPS5141586A (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/495,448 external-priority patent/US3969627A/en
Priority claimed from US05/495,377 external-priority patent/US4088936A/en
Priority claimed from US05/495,447 external-priority patent/US3944831A/en
Priority claimed from US05/495,493 external-priority patent/US3987672A/en
Priority claimed from US05/495,379 external-priority patent/US3952195A/en
Application filed filed Critical
Publication of JPS5141586A publication Critical patent/JPS5141586A/ja
Publication of JPS555049B2 publication Critical patent/JPS555049B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M17/00—Testing of vehicles
    • G01M17/007—Wheeled or endless-tracked vehicles
    • G01M17/02—Tyres
    • G01M17/028—Tyres using X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G01N23/185—Investigating the presence of flaws defects or foreign matter in tyres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/627—Specific applications or type of materials tyres

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP9546175A 1974-08-07 1975-08-07 Expired JPS555049B2 (ko)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US49537674A 1974-08-07 1974-08-07
US05/495,448 US3969627A (en) 1974-08-07 1974-08-07 System of positioning and inspecting tires
US05/495,377 US4088936A (en) 1974-08-07 1974-08-07 Tire inspection system
US05/495,447 US3944831A (en) 1974-08-07 1974-08-07 Tire inspection system with shielded X-ray source
US05/495,493 US3987672A (en) 1974-08-07 1974-08-07 Tire inspection system
US05/495,379 US3952195A (en) 1974-08-07 1974-08-07 System of inspecting tires with relatively movable inspection apparatus components

Publications (2)

Publication Number Publication Date
JPS5141586A JPS5141586A (ko) 1976-04-07
JPS555049B2 true JPS555049B2 (ko) 1980-02-04

Family

ID=27560067

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9546175A Expired JPS555049B2 (ko) 1974-08-07 1975-08-07

Country Status (2)

Country Link
JP (1) JPS555049B2 (ko)
DE (1) DE2535145C3 (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3952195A (en) * 1974-08-07 1976-04-20 Picker Corporation System of inspecting tires with relatively movable inspection apparatus components
US6016695A (en) * 1997-01-24 2000-01-25 Illinois Tool Works Inc. Tire uniformity testing system
DE102006045283A1 (de) * 2006-09-22 2008-04-10 Carl Zeiss 3D Automation Gmbh Vorbereitungsanordnung für bildgebende Meßvorrichtungen
DE102008037356C5 (de) * 2008-08-12 2020-09-17 Bernward Mähner Stapelmodul und Zentriermodul für eine Prüfanlage zum Prüfen von Reifen

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4968789A (ko) * 1972-09-01 1974-07-03

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4968789A (ko) * 1972-09-01 1974-07-03

Also Published As

Publication number Publication date
DE2535145C3 (de) 1980-10-23
JPS5141586A (ko) 1976-04-07
DE2535145B2 (de) 1980-02-28
DE2535145A1 (de) 1976-02-26

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