JPS555049B2 - - Google Patents

Info

Publication number
JPS555049B2
JPS555049B2 JP9546175A JP9546175A JPS555049B2 JP S555049 B2 JPS555049 B2 JP S555049B2 JP 9546175 A JP9546175 A JP 9546175A JP 9546175 A JP9546175 A JP 9546175A JP S555049 B2 JPS555049 B2 JP S555049B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9546175A
Other languages
Japanese (ja)
Other versions
JPS5141586A (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/495,493 external-priority patent/US3987672A/en
Priority claimed from US05/495,448 external-priority patent/US3969627A/en
Priority claimed from US05/495,447 external-priority patent/US3944831A/en
Priority claimed from US05/495,377 external-priority patent/US4088936A/en
Priority claimed from US05/495,379 external-priority patent/US3952195A/en
Application filed filed Critical
Publication of JPS5141586A publication Critical patent/JPS5141586A/ja
Publication of JPS555049B2 publication Critical patent/JPS555049B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M17/00—Testing of vehicles
    • G01M17/007—Wheeled or endless-tracked vehicles
    • G01M17/02—Tyres
    • G01M17/028—Tyres using X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G01N23/185—Investigating the presence of flaws defects or foreign matter in tyres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/627—Specific applications or type of materials tyres

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP9546175A 1974-08-07 1975-08-07 Expired JPS555049B2 (enrdf_load_stackoverflow)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US49537674A 1974-08-07 1974-08-07
US05/495,493 US3987672A (en) 1974-08-07 1974-08-07 Tire inspection system
US05/495,448 US3969627A (en) 1974-08-07 1974-08-07 System of positioning and inspecting tires
US05/495,447 US3944831A (en) 1974-08-07 1974-08-07 Tire inspection system with shielded X-ray source
US05/495,377 US4088936A (en) 1974-08-07 1974-08-07 Tire inspection system
US05/495,379 US3952195A (en) 1974-08-07 1974-08-07 System of inspecting tires with relatively movable inspection apparatus components

Publications (2)

Publication Number Publication Date
JPS5141586A JPS5141586A (enrdf_load_stackoverflow) 1976-04-07
JPS555049B2 true JPS555049B2 (enrdf_load_stackoverflow) 1980-02-04

Family

ID=27560067

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9546175A Expired JPS555049B2 (enrdf_load_stackoverflow) 1974-08-07 1975-08-07

Country Status (2)

Country Link
JP (1) JPS555049B2 (enrdf_load_stackoverflow)
DE (1) DE2535145C3 (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3952195A (en) * 1974-08-07 1976-04-20 Picker Corporation System of inspecting tires with relatively movable inspection apparatus components
US6016695A (en) * 1997-01-24 2000-01-25 Illinois Tool Works Inc. Tire uniformity testing system
DE102006045283A1 (de) * 2006-09-22 2008-04-10 Carl Zeiss 3D Automation Gmbh Vorbereitungsanordnung für bildgebende Meßvorrichtungen
DE102008037356C5 (de) * 2008-08-12 2020-09-17 Bernward Mähner Stapelmodul und Zentriermodul für eine Prüfanlage zum Prüfen von Reifen

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3789226A (en) * 1972-09-01 1974-01-29 Imagex Inc X-ray tire inspection machine

Also Published As

Publication number Publication date
JPS5141586A (enrdf_load_stackoverflow) 1976-04-07
DE2535145B2 (de) 1980-02-28
DE2535145A1 (de) 1976-02-26
DE2535145C3 (de) 1980-10-23

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