JPS5544345B1 - - Google Patents
Info
- Publication number
- JPS5544345B1 JPS5544345B1 JP7199070A JP7199070A JPS5544345B1 JP S5544345 B1 JPS5544345 B1 JP S5544345B1 JP 7199070 A JP7199070 A JP 7199070A JP 7199070 A JP7199070 A JP 7199070A JP S5544345 B1 JPS5544345 B1 JP S5544345B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/282—Static spectrometers using electrostatic analysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US85081069A | 1969-08-18 | 1969-08-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5544345B1 true JPS5544345B1 (cg-RX-API-DMAC10.html) | 1980-11-12 |
Family
ID=25309168
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7199070A Pending JPS5544345B1 (cg-RX-API-DMAC10.html) | 1969-08-18 | 1970-08-17 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US3665182A (cg-RX-API-DMAC10.html) |
| JP (1) | JPS5544345B1 (cg-RX-API-DMAC10.html) |
| CA (1) | CA925631A (cg-RX-API-DMAC10.html) |
| CH (1) | CH513512A (cg-RX-API-DMAC10.html) |
| DE (1) | DE2041422A1 (cg-RX-API-DMAC10.html) |
| FR (1) | FR2058139A5 (cg-RX-API-DMAC10.html) |
| GB (1) | GB1326051A (cg-RX-API-DMAC10.html) |
| NL (1) | NL7011751A (cg-RX-API-DMAC10.html) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3930155A (en) * | 1973-01-19 | 1975-12-30 | Hitachi Ltd | Ion microprobe analyser |
| US3916191A (en) * | 1974-03-01 | 1975-10-28 | Minnesota Mining & Mfg | Imaging apparatus and method for use with ion scattering spectrometer |
| US3916190A (en) * | 1974-03-01 | 1975-10-28 | Minnesota Mining & Mfg | Depth profile analysis apparatus |
| US3920989A (en) * | 1974-09-20 | 1975-11-18 | Minnesota Mining & Mfg | Ion scattering spectrometer utilizing charge exchange processes |
| US3937958A (en) | 1975-03-31 | 1976-02-10 | Minnesota Mining And Manufacturing Company | Charged particle beam apparatus |
| US4058724A (en) * | 1975-06-27 | 1977-11-15 | Minnesota Mining And Manufacturing Company | Ion Scattering spectrometer with two analyzers preferably in tandem |
| US3997846A (en) * | 1975-06-30 | 1976-12-14 | International Business Machines Corporation | Method and apparatus for electrostatic deflection of high current ion beams in scanning apparatus |
| US4363774A (en) * | 1978-01-24 | 1982-12-14 | Bennett Willard H | Production and utilization of ion cluster acceleration |
| US4657722A (en) * | 1980-05-14 | 1987-04-14 | Bennett Willard H | Ion cluster acceleration |
| GB8725459D0 (en) * | 1987-10-30 | 1987-12-02 | Nat Research Dev Corpn | Generating particle beams |
| US5302827A (en) * | 1993-05-11 | 1994-04-12 | Mks Instruments, Inc. | Quadrupole mass spectrometer |
| US5671045A (en) * | 1993-10-22 | 1997-09-23 | Masachusetts Institute Of Technology | Microwave plasma monitoring system for the elemental composition analysis of high temperature process streams |
| US5825485A (en) * | 1995-11-03 | 1998-10-20 | Cohn; Daniel R. | Compact trace element sensor which utilizes microwave generated plasma and which is portable by an individual |
| CN103336147B (zh) * | 2013-06-27 | 2015-05-27 | 西安交通大学 | 一种扫描离子电导显微镜的高频振动夹持器 |
-
1969
- 1969-08-18 US US850810A patent/US3665182A/en not_active Expired - Lifetime
-
1970
- 1970-08-07 NL NL7011751A patent/NL7011751A/xx unknown
- 1970-08-17 CA CA090949A patent/CA925631A/en not_active Expired
- 1970-08-17 CH CH1229970A patent/CH513512A/de not_active IP Right Cessation
- 1970-08-17 JP JP7199070A patent/JPS5544345B1/ja active Pending
- 1970-08-17 GB GB3957270A patent/GB1326051A/en not_active Expired
- 1970-08-17 DE DE19702041422 patent/DE2041422A1/de not_active Withdrawn
- 1970-08-17 FR FR7030151A patent/FR2058139A5/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| CH513512A (de) | 1971-09-30 |
| NL7011751A (cg-RX-API-DMAC10.html) | 1971-02-22 |
| CA925631A (en) | 1973-05-01 |
| US3665182A (en) | 1972-05-23 |
| DE2041422A1 (de) | 1971-03-11 |
| FR2058139A5 (cg-RX-API-DMAC10.html) | 1971-05-21 |
| GB1326051A (en) | 1973-08-08 |