CH513512A - Einrichtung zur Bestimmung der Elementenzusammensetzung einer Probe - Google Patents

Einrichtung zur Bestimmung der Elementenzusammensetzung einer Probe

Info

Publication number
CH513512A
CH513512A CH1229970A CH1229970A CH513512A CH 513512 A CH513512 A CH 513512A CH 1229970 A CH1229970 A CH 1229970A CH 1229970 A CH1229970 A CH 1229970A CH 513512 A CH513512 A CH 513512A
Authority
CH
Switzerland
Prior art keywords
sample
determining
elemental composition
elemental
composition
Prior art date
Application number
CH1229970A
Other languages
English (en)
Inventor
Frederick Goff Robert
Philip Smith David
Original Assignee
Minnesota Mining & Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Minnesota Mining & Mfg filed Critical Minnesota Mining & Mfg
Publication of CH513512A publication Critical patent/CH513512A/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/282—Static spectrometers using electrostatic analysers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CH1229970A 1969-08-18 1970-08-17 Einrichtung zur Bestimmung der Elementenzusammensetzung einer Probe CH513512A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US85081069A 1969-08-18 1969-08-18

Publications (1)

Publication Number Publication Date
CH513512A true CH513512A (de) 1971-09-30

Family

ID=25309168

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1229970A CH513512A (de) 1969-08-18 1970-08-17 Einrichtung zur Bestimmung der Elementenzusammensetzung einer Probe

Country Status (8)

Country Link
US (1) US3665182A (de)
JP (1) JPS5544345B1 (de)
CA (1) CA925631A (de)
CH (1) CH513512A (de)
DE (1) DE2041422A1 (de)
FR (1) FR2058139A5 (de)
GB (1) GB1326051A (de)
NL (1) NL7011751A (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3930155A (en) * 1973-01-19 1975-12-30 Hitachi Ltd Ion microprobe analyser
US3916190A (en) * 1974-03-01 1975-10-28 Minnesota Mining & Mfg Depth profile analysis apparatus
US3916191A (en) * 1974-03-01 1975-10-28 Minnesota Mining & Mfg Imaging apparatus and method for use with ion scattering spectrometer
US3920989A (en) * 1974-09-20 1975-11-18 Minnesota Mining & Mfg Ion scattering spectrometer utilizing charge exchange processes
US3937958A (en) 1975-03-31 1976-02-10 Minnesota Mining And Manufacturing Company Charged particle beam apparatus
US4058724A (en) * 1975-06-27 1977-11-15 Minnesota Mining And Manufacturing Company Ion Scattering spectrometer with two analyzers preferably in tandem
US3997846A (en) * 1975-06-30 1976-12-14 International Business Machines Corporation Method and apparatus for electrostatic deflection of high current ion beams in scanning apparatus
US4363774A (en) * 1978-01-24 1982-12-14 Bennett Willard H Production and utilization of ion cluster acceleration
US4657722A (en) * 1980-05-14 1987-04-14 Bennett Willard H Ion cluster acceleration
GB8725459D0 (en) * 1987-10-30 1987-12-02 Nat Research Dev Corpn Generating particle beams
US5302827A (en) * 1993-05-11 1994-04-12 Mks Instruments, Inc. Quadrupole mass spectrometer
US5671045A (en) * 1993-10-22 1997-09-23 Masachusetts Institute Of Technology Microwave plasma monitoring system for the elemental composition analysis of high temperature process streams
US5825485A (en) * 1995-11-03 1998-10-20 Cohn; Daniel R. Compact trace element sensor which utilizes microwave generated plasma and which is portable by an individual
CN103336147B (zh) * 2013-06-27 2015-05-27 西安交通大学 一种扫描离子电导显微镜的高频振动夹持器

Also Published As

Publication number Publication date
GB1326051A (en) 1973-08-08
DE2041422A1 (de) 1971-03-11
CA925631A (en) 1973-05-01
FR2058139A5 (de) 1971-05-21
US3665182A (en) 1972-05-23
NL7011751A (de) 1971-02-22
JPS5544345B1 (de) 1980-11-12

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Legal Events

Date Code Title Description
PL Patent ceased