JPS5542368B2 - - Google Patents
Info
- Publication number
- JPS5542368B2 JPS5542368B2 JP8147976A JP8147976A JPS5542368B2 JP S5542368 B2 JPS5542368 B2 JP S5542368B2 JP 8147976 A JP8147976 A JP 8147976A JP 8147976 A JP8147976 A JP 8147976A JP S5542368 B2 JPS5542368 B2 JP S5542368B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/60—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
- G01J5/602—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature using selective, monochromatic or bandpass filtering
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Radiation Pyrometers (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8147976A JPS538155A (en) | 1976-07-10 | 1976-07-10 | Viewing photographying and temperature measuring method of high temperature microscope |
| DE19762644299 DE2644299C3 (de) | 1976-07-10 | 1976-09-30 | Hochtemperaturmikroskop |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8147976A JPS538155A (en) | 1976-07-10 | 1976-07-10 | Viewing photographying and temperature measuring method of high temperature microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS538155A JPS538155A (en) | 1978-01-25 |
| JPS5542368B2 true JPS5542368B2 (da) | 1980-10-30 |
Family
ID=13747532
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8147976A Granted JPS538155A (en) | 1976-07-10 | 1976-07-10 | Viewing photographying and temperature measuring method of high temperature microscope |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPS538155A (da) |
| DE (1) | DE2644299C3 (da) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57183830A (en) * | 1981-05-07 | 1982-11-12 | Olympus Optical Co | Photographing system of eye bottom camera |
| DE19643574C2 (de) * | 1996-10-11 | 1999-12-23 | Ver Energiewerke Ag | Verfahren zur Bestimmung des Zustandes eines Weichstoffkompensators für die Abdichtung an einem Dampfkessel |
| DE102007035609B4 (de) * | 2007-07-30 | 2021-09-16 | Ivoclar Vivadent Ag | Verfahren zur optischen Kontrolle des Verlaufs von einem auf einer Oberfläche eines Körpers erfolgenden physikalischen und/oder chemischen Prozesses |
-
1976
- 1976-07-10 JP JP8147976A patent/JPS538155A/ja active Granted
- 1976-09-30 DE DE19762644299 patent/DE2644299C3/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS538155A (en) | 1978-01-25 |
| DE2644299A1 (de) | 1978-01-12 |
| DE2644299B2 (de) | 1979-03-29 |
| DE2644299C3 (de) | 1979-11-22 |