JPS5535234A - Ic test equipment - Google Patents

Ic test equipment

Info

Publication number
JPS5535234A
JPS5535234A JP10825778A JP10825778A JPS5535234A JP S5535234 A JPS5535234 A JP S5535234A JP 10825778 A JP10825778 A JP 10825778A JP 10825778 A JP10825778 A JP 10825778A JP S5535234 A JPS5535234 A JP S5535234A
Authority
JP
Japan
Prior art keywords
coincidence
longitudinal
test
stored
flgs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10825778A
Other languages
Japanese (ja)
Other versions
JPS6046668B2 (en
Inventor
Junji Nishiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP53108257A priority Critical patent/JPS6046668B2/en
Priority to US06/069,345 priority patent/US4313200A/en
Publication of JPS5535234A publication Critical patent/JPS5535234A/en
Publication of JPS6046668B2 publication Critical patent/JPS6046668B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To make it possible to test a lateral coincidence system and longitudinal coincidence system by the same equipment by providing and controlling a control file.
CONSTITUTION: Bottle assignment data is stored in register 28 and instruction FLGS indicating a coincidence detection test is in command part 26 of a control file; in case of a dissidence, the same pattern is supplied to tested IC until a coincidence is detected. As for a longitudinal coincidence detection test, instruction FLGS indicating coincidence detection is stored in corresponding command part 26 at an address corresponding to its longitudinal input pattern and in its operand part 27, the initial address of the longitudinal coincidence test, for example, is stored, so that the longitudinal coincidence test will automatically be made. In this way, the lateral and longitudinal coincidence systems can be tested by the same unit.
COPYRIGHT: (C)1980,JPO&Japio
JP53108257A 1978-08-28 1978-09-04 IC test equipment Expired JPS6046668B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP53108257A JPS6046668B2 (en) 1978-09-04 1978-09-04 IC test equipment
US06/069,345 US4313200A (en) 1978-08-28 1979-08-24 Logic test system permitting test pattern changes without dummy cycles

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53108257A JPS6046668B2 (en) 1978-09-04 1978-09-04 IC test equipment

Publications (2)

Publication Number Publication Date
JPS5535234A true JPS5535234A (en) 1980-03-12
JPS6046668B2 JPS6046668B2 (en) 1985-10-17

Family

ID=14480061

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53108257A Expired JPS6046668B2 (en) 1978-08-28 1978-09-04 IC test equipment

Country Status (1)

Country Link
JP (1) JPS6046668B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60235365A (en) * 1984-05-08 1985-11-22 Fuji Electric Corp Res & Dev Ltd Structure of plural cell-stack fuel cell

Also Published As

Publication number Publication date
JPS6046668B2 (en) 1985-10-17

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