JPS5535234A - Ic test equipment - Google Patents
Ic test equipmentInfo
- Publication number
- JPS5535234A JPS5535234A JP10825778A JP10825778A JPS5535234A JP S5535234 A JPS5535234 A JP S5535234A JP 10825778 A JP10825778 A JP 10825778A JP 10825778 A JP10825778 A JP 10825778A JP S5535234 A JPS5535234 A JP S5535234A
- Authority
- JP
- Japan
- Prior art keywords
- coincidence
- longitudinal
- test
- stored
- flgs
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To make it possible to test a lateral coincidence system and longitudinal coincidence system by the same equipment by providing and controlling a control file.
CONSTITUTION: Bottle assignment data is stored in register 28 and instruction FLGS indicating a coincidence detection test is in command part 26 of a control file; in case of a dissidence, the same pattern is supplied to tested IC until a coincidence is detected. As for a longitudinal coincidence detection test, instruction FLGS indicating coincidence detection is stored in corresponding command part 26 at an address corresponding to its longitudinal input pattern and in its operand part 27, the initial address of the longitudinal coincidence test, for example, is stored, so that the longitudinal coincidence test will automatically be made. In this way, the lateral and longitudinal coincidence systems can be tested by the same unit.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53108257A JPS6046668B2 (en) | 1978-09-04 | 1978-09-04 | IC test equipment |
US06/069,345 US4313200A (en) | 1978-08-28 | 1979-08-24 | Logic test system permitting test pattern changes without dummy cycles |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53108257A JPS6046668B2 (en) | 1978-09-04 | 1978-09-04 | IC test equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5535234A true JPS5535234A (en) | 1980-03-12 |
JPS6046668B2 JPS6046668B2 (en) | 1985-10-17 |
Family
ID=14480061
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53108257A Expired JPS6046668B2 (en) | 1978-08-28 | 1978-09-04 | IC test equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6046668B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60235365A (en) * | 1984-05-08 | 1985-11-22 | Fuji Electric Corp Res & Dev Ltd | Structure of plural cell-stack fuel cell |
-
1978
- 1978-09-04 JP JP53108257A patent/JPS6046668B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS6046668B2 (en) | 1985-10-17 |
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