JPS5531983B2 - - Google Patents
Info
- Publication number
- JPS5531983B2 JPS5531983B2 JP10368872A JP10368872A JPS5531983B2 JP S5531983 B2 JPS5531983 B2 JP S5531983B2 JP 10368872 A JP10368872 A JP 10368872A JP 10368872 A JP10368872 A JP 10368872A JP S5531983 B2 JPS5531983 B2 JP S5531983B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
- H01J9/14—Manufacture of electrodes or electrode systems of non-emitting electrodes
- H01J9/142—Manufacture of electrodes or electrode systems of non-emitting electrodes of shadow-masks for colour television tubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US19152271A | 1971-10-21 | 1971-10-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4851580A JPS4851580A (OSRAM) | 1973-07-19 |
| JPS5531983B2 true JPS5531983B2 (OSRAM) | 1980-08-22 |
Family
ID=22705823
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10368872A Expired JPS5531983B2 (OSRAM) | 1971-10-21 | 1972-10-18 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US3785738A (OSRAM) |
| JP (1) | JPS5531983B2 (OSRAM) |
| BE (1) | BE789977A (OSRAM) |
| DE (1) | DE2240990C3 (OSRAM) |
| FR (1) | FR2156720B1 (OSRAM) |
| GB (1) | GB1370967A (OSRAM) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4107541A (en) * | 1977-03-04 | 1978-08-15 | Jerry Kirsch | Workpiece hole presence and absence inspector |
| EP0254200A1 (de) * | 1986-07-18 | 1988-01-27 | Siemens Aktiengesellschaft | Verfahren zum Prüfen auf fehlerhafte durchkontaktierte Bohrungen bei gedruckten Leiterplatten |
| GB2207237A (en) * | 1987-07-22 | 1989-01-25 | Philips Nv | A method of inspecting apertured mask sheet |
| JP2559285B2 (ja) * | 1990-03-29 | 1996-12-04 | 株式会社イセキ開発工機 | シールド型トンネル掘削機 |
| US5245177A (en) * | 1991-10-24 | 1993-09-14 | Schiller Norman H | Electro-optical system for detecting the presence of an object within a predetermined detection system |
| WO1993016352A1 (en) * | 1992-02-05 | 1993-08-19 | Laser Machining, Inc. | Reflective collimator |
| US6350038B1 (en) * | 1999-06-03 | 2002-02-26 | James L. Fergason | Right angle viewing inspection device and method |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1848874A (en) * | 1929-09-25 | 1932-03-08 | fitz gerald | |
| NL124970C (OSRAM) * | 1960-12-13 | |||
| FR1509107A (fr) * | 1966-11-29 | 1968-01-12 | Optique Soc Gen | Procédé et appareil de détection des défauts d'une matière transparente |
| US3514208A (en) * | 1967-01-30 | 1970-05-26 | Admiral Corp | Aperture mask inspection apparatus |
| BE756182A (fr) * | 1970-01-15 | 1971-02-15 | Buckbee Mears Co | Appareil de mesure pour masques d'ombre |
-
0
- BE BE789977D patent/BE789977A/xx unknown
-
1971
- 1971-10-21 US US00191522A patent/US3785738A/en not_active Expired - Lifetime
-
1972
- 1972-08-07 GB GB3675372A patent/GB1370967A/en not_active Expired
- 1972-08-21 DE DE2240990A patent/DE2240990C3/de not_active Expired
- 1972-10-12 FR FR7236207A patent/FR2156720B1/fr not_active Expired
- 1972-10-18 JP JP10368872A patent/JPS5531983B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE2240990A1 (de) | 1973-04-26 |
| DE2240990C3 (de) | 1981-10-15 |
| BE789977A (fr) | 1973-02-01 |
| US3785738A (en) | 1974-01-15 |
| FR2156720B1 (OSRAM) | 1976-08-20 |
| FR2156720A1 (OSRAM) | 1973-06-01 |
| JPS4851580A (OSRAM) | 1973-07-19 |
| DE2240990B2 (de) | 1980-10-30 |
| GB1370967A (en) | 1974-10-23 |