FR2156720A1 - - Google Patents

Info

Publication number
FR2156720A1
FR2156720A1 FR7236207A FR7236207A FR2156720A1 FR 2156720 A1 FR2156720 A1 FR 2156720A1 FR 7236207 A FR7236207 A FR 7236207A FR 7236207 A FR7236207 A FR 7236207A FR 2156720 A1 FR2156720 A1 FR 2156720A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7236207A
Other languages
French (fr)
Other versions
FR2156720B1 (OSRAM
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Buckbee Mears Co
Original Assignee
Buckbee Mears Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Buckbee Mears Co filed Critical Buckbee Mears Co
Publication of FR2156720A1 publication Critical patent/FR2156720A1/fr
Application granted granted Critical
Publication of FR2156720B1 publication Critical patent/FR2156720B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/02—Manufacture of electrodes or electrode systems
    • H01J9/14—Manufacture of electrodes or electrode systems of non-emitting electrodes
    • H01J9/142—Manufacture of electrodes or electrode systems of non-emitting electrodes of shadow-masks for colour television tubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
FR7236207A 1971-10-21 1972-10-12 Expired FR2156720B1 (OSRAM)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US19152271A 1971-10-21 1971-10-21

Publications (2)

Publication Number Publication Date
FR2156720A1 true FR2156720A1 (OSRAM) 1973-06-01
FR2156720B1 FR2156720B1 (OSRAM) 1976-08-20

Family

ID=22705823

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7236207A Expired FR2156720B1 (OSRAM) 1971-10-21 1972-10-12

Country Status (6)

Country Link
US (1) US3785738A (OSRAM)
JP (1) JPS5531983B2 (OSRAM)
BE (1) BE789977A (OSRAM)
DE (1) DE2240990C3 (OSRAM)
FR (1) FR2156720B1 (OSRAM)
GB (1) GB1370967A (OSRAM)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4107541A (en) * 1977-03-04 1978-08-15 Jerry Kirsch Workpiece hole presence and absence inspector
EP0254200A1 (de) * 1986-07-18 1988-01-27 Siemens Aktiengesellschaft Verfahren zum Prüfen auf fehlerhafte durchkontaktierte Bohrungen bei gedruckten Leiterplatten
GB2207237A (en) * 1987-07-22 1989-01-25 Philips Nv A method of inspecting apertured mask sheet
JP2559285B2 (ja) * 1990-03-29 1996-12-04 株式会社イセキ開発工機 シールド型トンネル掘削機
US5245177A (en) * 1991-10-24 1993-09-14 Schiller Norman H Electro-optical system for detecting the presence of an object within a predetermined detection system
WO1993016352A1 (en) * 1992-02-05 1993-08-19 Laser Machining, Inc. Reflective collimator
US6350038B1 (en) * 1999-06-03 2002-02-26 James L. Fergason Right angle viewing inspection device and method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1848874A (en) * 1929-09-25 1932-03-08 fitz gerald
NL124970C (OSRAM) * 1960-12-13
FR1509107A (fr) * 1966-11-29 1968-01-12 Optique Soc Gen Procédé et appareil de détection des défauts d'une matière transparente
US3514208A (en) * 1967-01-30 1970-05-26 Admiral Corp Aperture mask inspection apparatus
BE756182A (fr) * 1970-01-15 1971-02-15 Buckbee Mears Co Appareil de mesure pour masques d'ombre

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
NEANT *

Also Published As

Publication number Publication date
DE2240990A1 (de) 1973-04-26
DE2240990C3 (de) 1981-10-15
BE789977A (fr) 1973-02-01
US3785738A (en) 1974-01-15
FR2156720B1 (OSRAM) 1976-08-20
JPS5531983B2 (OSRAM) 1980-08-22
JPS4851580A (OSRAM) 1973-07-19
DE2240990B2 (de) 1980-10-30
GB1370967A (en) 1974-10-23

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Legal Events

Date Code Title Description
ST Notification of lapse