JPS5524575B2 - - Google Patents
Info
- Publication number
- JPS5524575B2 JPS5524575B2 JP5965475A JP5965475A JPS5524575B2 JP S5524575 B2 JPS5524575 B2 JP S5524575B2 JP 5965475 A JP5965475 A JP 5965475A JP 5965475 A JP5965475 A JP 5965475A JP S5524575 B2 JPS5524575 B2 JP S5524575B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5965475A JPS51136478A (en) | 1975-05-21 | 1975-05-21 | Defect inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5965475A JPS51136478A (en) | 1975-05-21 | 1975-05-21 | Defect inspection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS51136478A JPS51136478A (en) | 1976-11-25 |
| JPS5524575B2 true JPS5524575B2 (ref) | 1980-06-30 |
Family
ID=13119392
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5965475A Granted JPS51136478A (en) | 1975-05-21 | 1975-05-21 | Defect inspection device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS51136478A (ref) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5754844A (en) * | 1980-09-19 | 1982-04-01 | Nippon Steel Corp | Flaw signal processing apparatus |
| JPH02248845A (ja) * | 1989-03-22 | 1990-10-04 | Kyodo Printing Co Ltd | カード表面欠陥検査装置 |
| KR101380305B1 (ko) * | 2007-06-22 | 2014-04-03 | 삼성디스플레이 주식회사 | 백라이트 어셈블리 |
-
1975
- 1975-05-21 JP JP5965475A patent/JPS51136478A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS51136478A (en) | 1976-11-25 |