JPS5520382B2 - - Google Patents
Info
- Publication number
- JPS5520382B2 JPS5520382B2 JP1791276A JP1791276A JPS5520382B2 JP S5520382 B2 JPS5520382 B2 JP S5520382B2 JP 1791276 A JP1791276 A JP 1791276A JP 1791276 A JP1791276 A JP 1791276A JP S5520382 B2 JPS5520382 B2 JP S5520382B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Element Separation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1791276A JPS52101979A (en) | 1976-02-23 | 1976-02-23 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1791276A JPS52101979A (en) | 1976-02-23 | 1976-02-23 | Semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS52101979A JPS52101979A (en) | 1977-08-26 |
JPS5520382B2 true JPS5520382B2 (en) | 1980-06-02 |
Family
ID=11956952
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1791276A Granted JPS52101979A (en) | 1976-02-23 | 1976-02-23 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS52101979A (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5658242A (en) * | 1979-10-17 | 1981-05-21 | Fujitsu Ltd | Manufacture of semiconductor integrated circuit |
JPH01140638A (en) * | 1987-11-26 | 1989-06-01 | Nec Corp | Semiconductor device |
JPH0430548A (en) * | 1990-05-28 | 1992-02-03 | Fujitsu Ltd | Semiconductor device, and test method |
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1976
- 1976-02-23 JP JP1791276A patent/JPS52101979A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS52101979A (en) | 1977-08-26 |