JPS55181566U - - Google Patents
Info
- Publication number
- JPS55181566U JPS55181566U JP8230679U JP8230679U JPS55181566U JP S55181566 U JPS55181566 U JP S55181566U JP 8230679 U JP8230679 U JP 8230679U JP 8230679 U JP8230679 U JP 8230679U JP S55181566 U JPS55181566 U JP S55181566U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8230679U JPS55181566U (zh) | 1979-06-13 | 1979-06-13 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8230679U JPS55181566U (zh) | 1979-06-13 | 1979-06-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55181566U true JPS55181566U (zh) | 1980-12-26 |
Family
ID=29315538
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8230679U Pending JPS55181566U (zh) | 1979-06-13 | 1979-06-13 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55181566U (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002542587A (ja) * | 1999-04-20 | 2002-12-10 | コミツサリア タ レネルジー アトミーク | イオン化チャンバー、β線放出ガスの活性測定シーケンスおよびその使用方法 |
JP2018155502A (ja) * | 2017-03-15 | 2018-10-04 | 株式会社島津製作所 | 放射線格子検出器およびx線検査装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50115986A (zh) * | 1974-02-23 | 1975-09-10 | ||
JPS5187981A (ja) * | 1975-01-31 | 1976-07-31 | Hitachi Ltd | Haisensonokeiseihoho |
JPS5270780A (en) * | 1975-12-10 | 1977-06-13 | Toshiba Corp | Manufacture of semiconductor device |
JPS52149976A (en) * | 1976-06-09 | 1977-12-13 | Toshiba Corp | Mask for x-ray exposure |
-
1979
- 1979-06-13 JP JP8230679U patent/JPS55181566U/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50115986A (zh) * | 1974-02-23 | 1975-09-10 | ||
JPS5187981A (ja) * | 1975-01-31 | 1976-07-31 | Hitachi Ltd | Haisensonokeiseihoho |
JPS5270780A (en) * | 1975-12-10 | 1977-06-13 | Toshiba Corp | Manufacture of semiconductor device |
JPS52149976A (en) * | 1976-06-09 | 1977-12-13 | Toshiba Corp | Mask for x-ray exposure |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002542587A (ja) * | 1999-04-20 | 2002-12-10 | コミツサリア タ レネルジー アトミーク | イオン化チャンバー、β線放出ガスの活性測定シーケンスおよびその使用方法 |
JP2018155502A (ja) * | 2017-03-15 | 2018-10-04 | 株式会社島津製作所 | 放射線格子検出器およびx線検査装置 |