JPS5517479A - Polishing method for test piece for metal microscope and test piece - Google Patents

Polishing method for test piece for metal microscope and test piece

Info

Publication number
JPS5517479A
JPS5517479A JP9109878A JP9109878A JPS5517479A JP S5517479 A JPS5517479 A JP S5517479A JP 9109878 A JP9109878 A JP 9109878A JP 9109878 A JP9109878 A JP 9109878A JP S5517479 A JPS5517479 A JP S5517479A
Authority
JP
Japan
Prior art keywords
test piece
holder
lifting
polishing disc
gear
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9109878A
Other languages
Japanese (ja)
Inventor
Misao Nagano
Ashihiro Kawasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP9109878A priority Critical patent/JPS5517479A/en
Publication of JPS5517479A publication Critical patent/JPS5517479A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/32—Polishing; Etching

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PURPOSE:To make efficient the polishing of test piece, by providing the lifting up and down and rotating holder holding test piece with magnetic force to horizontal polishing disc. CONSTITUTION:The gear 23 is mounted to the rotary shaft 22 of the polishing disc 21 sticking with polish paper or cloth on the surface plated in revolution free on the stand 20, the follower gear 25 geared with the gear 23 is formed at the external circumference of the disc main body at the upper part of the polishing disc 21, the test piece holder 24 containing the electromagnetic coil inside of it is provided in rotation and lifting up and down free, and the electromagnetic coil can be fed by DC current from external via the brushes 31 mounted on the slider 29 and slip rings 32 mounted on the holder rotary shaft 3. Thus, the test piece P is inserted to the concave of the test piece holder 24 and after holding it with the electromagnetic force, the removal of the test piece P and polishment can quickly be made by turning the test piece 24 and lifting it up or down and turning the polishing disc 21.
JP9109878A 1978-07-25 1978-07-25 Polishing method for test piece for metal microscope and test piece Pending JPS5517479A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9109878A JPS5517479A (en) 1978-07-25 1978-07-25 Polishing method for test piece for metal microscope and test piece

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9109878A JPS5517479A (en) 1978-07-25 1978-07-25 Polishing method for test piece for metal microscope and test piece

Publications (1)

Publication Number Publication Date
JPS5517479A true JPS5517479A (en) 1980-02-06

Family

ID=14017035

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9109878A Pending JPS5517479A (en) 1978-07-25 1978-07-25 Polishing method for test piece for metal microscope and test piece

Country Status (1)

Country Link
JP (1) JPS5517479A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5768749U (en) * 1980-10-13 1982-04-24
JPS61195961U (en) * 1985-05-29 1986-12-06
JPH0387557U (en) * 1989-12-19 1991-09-05
JP2011242327A (en) * 2010-05-20 2011-12-01 Sumitomo Electric Ind Ltd Section formation method, fixing jig and measurement method for sample
CN109459285A (en) * 2018-11-28 2019-03-12 江阴兴澄特种钢铁有限公司 A kind of device and fixing means for fixing irregular metallographic specimen
CN110666994A (en) * 2019-09-17 2020-01-10 北京自动化控制设备研究所 Method for protecting small hole position in optical processing of small hole glass element

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5768749U (en) * 1980-10-13 1982-04-24
JPS61195961U (en) * 1985-05-29 1986-12-06
JPH0351095Y2 (en) * 1985-05-29 1991-10-31
JPH0387557U (en) * 1989-12-19 1991-09-05
JP2011242327A (en) * 2010-05-20 2011-12-01 Sumitomo Electric Ind Ltd Section formation method, fixing jig and measurement method for sample
CN109459285A (en) * 2018-11-28 2019-03-12 江阴兴澄特种钢铁有限公司 A kind of device and fixing means for fixing irregular metallographic specimen
CN110666994A (en) * 2019-09-17 2020-01-10 北京自动化控制设备研究所 Method for protecting small hole position in optical processing of small hole glass element

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