JPS5515549B2 - - Google Patents
Info
- Publication number
- JPS5515549B2 JPS5515549B2 JP8096877A JP8096877A JPS5515549B2 JP S5515549 B2 JPS5515549 B2 JP S5515549B2 JP 8096877 A JP8096877 A JP 8096877A JP 8096877 A JP8096877 A JP 8096877A JP S5515549 B2 JPS5515549 B2 JP S5515549B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
- C23C14/545—Controlling the film thickness or evaporation rate using measurement on deposited material
- C23C14/546—Controlling the film thickness or evaporation rate using measurement on deposited material using crystal oscillators
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
- Physical Vapour Deposition (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8096877A JPS5431089A (en) | 1977-07-08 | 1977-07-08 | Vacuum metallizer |
GB7827597A GB2000882B (en) | 1977-07-01 | 1978-06-22 | Vacuum vapour-deposition apparatus |
US05/918,272 US4207836A (en) | 1977-07-01 | 1978-06-22 | Vacuum vapor-deposition apparatus |
DE2828651A DE2828651C2 (de) | 1977-07-01 | 1978-06-29 | Vakuum-Aufdampfeinrichtung |
FR7819740A FR2396093A1 (fr) | 1977-07-01 | 1978-06-30 | Appareil pour le depot en phase de vapeurs sous vide |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8096877A JPS5431089A (en) | 1977-07-08 | 1977-07-08 | Vacuum metallizer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5431089A JPS5431089A (en) | 1979-03-07 |
JPS5515549B2 true JPS5515549B2 ( ) | 1980-04-24 |
Family
ID=13733303
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8096877A Granted JPS5431089A (en) | 1977-07-01 | 1977-07-08 | Vacuum metallizer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5431089A ( ) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61101309U ( ) * | 1984-12-10 | 1986-06-28 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2825298B2 (ja) * | 1990-01-08 | 1998-11-18 | 松下電器産業株式会社 | 膜厚測定装置 |
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1977
- 1977-07-08 JP JP8096877A patent/JPS5431089A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61101309U ( ) * | 1984-12-10 | 1986-06-28 |
Also Published As
Publication number | Publication date |
---|---|
JPS5431089A (en) | 1979-03-07 |