JPS55151268A - Measuring instrument for characteristics of extremely-small electric parts - Google Patents

Measuring instrument for characteristics of extremely-small electric parts

Info

Publication number
JPS55151268A
JPS55151268A JP5952679A JP5952679A JPS55151268A JP S55151268 A JPS55151268 A JP S55151268A JP 5952679 A JP5952679 A JP 5952679A JP 5952679 A JP5952679 A JP 5952679A JP S55151268 A JPS55151268 A JP S55151268A
Authority
JP
Japan
Prior art keywords
lead wire
measuring instrument
probe
coil spring
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5952679A
Other languages
Japanese (ja)
Inventor
Kazuo Okubo
Takashi Matsui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP5952679A priority Critical patent/JPS55151268A/en
Publication of JPS55151268A publication Critical patent/JPS55151268A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

PURPOSE: To make measurement of high precision possible while eliminating the need to bend a lead wire and for clipping by a clip, by equipping a probe at the tip of a sliding piece, which slides on the substrate of a measuring instrument, via a coil spring.
CONSTITUTION: On substrate 3 of a measuring instrument, sliding pieces 6 are radially provided and probe 8 is equipped via coil spring 7 at one terminal closer to measured-body installation hole 4 of probe 8 is brought into contact with the lead wire of a measured body by the proper contact pressure of coil spring 7. In the above-mentioned constitution, turning rotary disk 10 makes sliding piece 6 move toward linear IC1 in the center and meet the root of lead wire 1b, and consequently characteristic measurement is possible only through the one-touch operation of the rotary disk. Consequently, the contact pressure can be kept adequate without any error contact to the lead wire, so that the high precision measurement will be taken.
COPYRIGHT: (C)1980,JPO&Japio
JP5952679A 1979-05-15 1979-05-15 Measuring instrument for characteristics of extremely-small electric parts Pending JPS55151268A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5952679A JPS55151268A (en) 1979-05-15 1979-05-15 Measuring instrument for characteristics of extremely-small electric parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5952679A JPS55151268A (en) 1979-05-15 1979-05-15 Measuring instrument for characteristics of extremely-small electric parts

Publications (1)

Publication Number Publication Date
JPS55151268A true JPS55151268A (en) 1980-11-25

Family

ID=13115797

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5952679A Pending JPS55151268A (en) 1979-05-15 1979-05-15 Measuring instrument for characteristics of extremely-small electric parts

Country Status (1)

Country Link
JP (1) JPS55151268A (en)

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