JPS55149804A - Profile measuring apparatus for accumulated matter in high blast furnace - Google Patents

Profile measuring apparatus for accumulated matter in high blast furnace

Info

Publication number
JPS55149804A
JPS55149804A JP5696479A JP5696479A JPS55149804A JP S55149804 A JPS55149804 A JP S55149804A JP 5696479 A JP5696479 A JP 5696479A JP 5696479 A JP5696479 A JP 5696479A JP S55149804 A JPS55149804 A JP S55149804A
Authority
JP
Japan
Prior art keywords
light detector
blast furnace
pulse
measuring apparatus
high speed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5696479A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6151722B2 (enrdf_load_stackoverflow
Inventor
Takeji Harada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5696479A priority Critical patent/JPS55149804A/ja
Publication of JPS55149804A publication Critical patent/JPS55149804A/ja
Publication of JPS6151722B2 publication Critical patent/JPS6151722B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Levels Of Liquids Or Fluent Solid Materials (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP5696479A 1979-05-11 1979-05-11 Profile measuring apparatus for accumulated matter in high blast furnace Granted JPS55149804A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5696479A JPS55149804A (en) 1979-05-11 1979-05-11 Profile measuring apparatus for accumulated matter in high blast furnace

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5696479A JPS55149804A (en) 1979-05-11 1979-05-11 Profile measuring apparatus for accumulated matter in high blast furnace

Publications (2)

Publication Number Publication Date
JPS55149804A true JPS55149804A (en) 1980-11-21
JPS6151722B2 JPS6151722B2 (enrdf_load_stackoverflow) 1986-11-10

Family

ID=13042207

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5696479A Granted JPS55149804A (en) 1979-05-11 1979-05-11 Profile measuring apparatus for accumulated matter in high blast furnace

Country Status (1)

Country Link
JP (1) JPS55149804A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5953149A (ja) * 1982-09-17 1984-03-27 Nippon Tsushin Gijutsu Kk ロボツト用計測ヘツド
JPH03125926A (ja) * 1989-10-04 1991-05-29 Sokkisha Co Ltd 体積測定装置
CN111043978A (zh) * 2019-11-29 2020-04-21 北京卫星制造厂有限公司 一种多目dic变形场测量装置和方法
CN111998797A (zh) * 2020-07-20 2020-11-27 成都飞机工业（集团）有限责任公司 一种拍照式三维扫描仪的扫描轨迹规划方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5211056A (en) * 1975-07-16 1977-01-27 Nippon Steel Corp Surface form detecting method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5211056A (en) * 1975-07-16 1977-01-27 Nippon Steel Corp Surface form detecting method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5953149A (ja) * 1982-09-17 1984-03-27 Nippon Tsushin Gijutsu Kk ロボツト用計測ヘツド
JPH03125926A (ja) * 1989-10-04 1991-05-29 Sokkisha Co Ltd 体積測定装置
CN111043978A (zh) * 2019-11-29 2020-04-21 北京卫星制造厂有限公司 一种多目dic变形场测量装置和方法
CN111043978B (zh) * 2019-11-29 2021-09-07 北京卫星制造厂有限公司 一种多目dic变形场测量装置和方法
CN111998797A (zh) * 2020-07-20 2020-11-27 成都飞机工业（集团）有限责任公司 一种拍照式三维扫描仪的扫描轨迹规划方法
CN111998797B (zh) * 2020-07-20 2021-04-27 成都飞机工业（集团）有限责任公司 一种拍照式三维扫描仪的扫描轨迹规划方法

Also Published As

Publication number Publication date
JPS6151722B2 (enrdf_load_stackoverflow) 1986-11-10

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