JPS5514379B2 - - Google Patents

Info

Publication number
JPS5514379B2
JPS5514379B2 JP5978773A JP5978773A JPS5514379B2 JP S5514379 B2 JPS5514379 B2 JP S5514379B2 JP 5978773 A JP5978773 A JP 5978773A JP 5978773 A JP5978773 A JP 5978773A JP S5514379 B2 JPS5514379 B2 JP S5514379B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP5978773A
Other languages
Japanese (ja)
Other versions
JPS5011084A (fr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5978773A priority Critical patent/JPS5514379B2/ja
Priority to US473898A priority patent/US3914605A/en
Publication of JPS5011084A publication Critical patent/JPS5011084A/ja
Publication of JPS5514379B2 publication Critical patent/JPS5514379B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G01N2223/0568—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction spectro-diffractometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/418—Imaging electron microscope

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP5978773A 1973-05-30 1973-05-30 Expired JPS5514379B2 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP5978773A JPS5514379B2 (fr) 1973-05-30 1973-05-30
US473898A US3914605A (en) 1973-05-30 1974-05-28 X-ray spectroscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5978773A JPS5514379B2 (fr) 1973-05-30 1973-05-30

Publications (2)

Publication Number Publication Date
JPS5011084A JPS5011084A (fr) 1975-02-04
JPS5514379B2 true JPS5514379B2 (fr) 1980-04-16

Family

ID=13123335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5978773A Expired JPS5514379B2 (fr) 1973-05-30 1973-05-30

Country Status (2)

Country Link
US (1) US3914605A (fr)
JP (1) JPS5514379B2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4101342A1 (fr) 2021-06-09 2022-12-14 King Slide Works Co., Ltd. Ensemble rail coulissant

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4365156A (en) * 1980-12-23 1982-12-21 Bell Telephone Laboratories, Incorporated Tunable θ-2θ device
US4398823A (en) * 1981-06-01 1983-08-16 Baker Manufacturing Company Extended range monochromator
DE3125803A1 (de) * 1981-06-30 1983-01-13 Siemens AG, 1000 Berlin und 8000 München Kristall-roentgen-sequenzspektrometer
NL8300420A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
US4599741A (en) * 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4882780A (en) * 1983-11-04 1989-11-21 University Of Southern California Scanning monochromator crystal and related method
FR2600417B1 (fr) * 1986-06-19 1990-01-12 Centre Nat Rech Scient Spectrometrie de rayons x a focalisation par cristal courbe et a chambre d'emission de rayons x polyvalente
JPS6417369A (en) * 1987-07-10 1989-01-20 Jeol Ltd Spectrum display unit in x-ray microanalyzer and the like
JPH0238850A (ja) * 1988-07-28 1990-02-08 Jeol Ltd Ｘ線分光器を用いた定性分析方法
JP2766199B2 (ja) * 1994-10-04 1998-06-18 株式会社神戸製鋼所 Ｘ線分析装置
JP2002329473A (ja) * 2001-02-27 2002-11-15 Jeol Ltd Ｘ線分光器を備えた透過型電子顕微鏡
WO2017117197A1 (fr) * 2015-12-28 2017-07-06 University Of Washington Procédés pour aligner un spectromètre
CN114930135A (zh) * 2019-10-21 2022-08-19 易艾克弗斯有限公司 光谱仪

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE495202A (fr) * 1949-04-19

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4101342A1 (fr) 2021-06-09 2022-12-14 King Slide Works Co., Ltd. Ensemble rail coulissant

Also Published As

Publication number Publication date
US3914605A (en) 1975-10-21
JPS5011084A (fr) 1975-02-04

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