JPS55143520A - Adjustment of optical beam impinge on target and device therefor - Google Patents

Adjustment of optical beam impinge on target and device therefor

Info

Publication number
JPS55143520A
JPS55143520A JP4951180A JP4951180A JPS55143520A JP S55143520 A JPS55143520 A JP S55143520A JP 4951180 A JP4951180 A JP 4951180A JP 4951180 A JP4951180 A JP 4951180A JP S55143520 A JPS55143520 A JP S55143520A
Authority
JP
Japan
Prior art keywords
adjustment
target
optical beam
device therefor
beam impinge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4951180A
Other languages
English (en)
Japanese (ja)
Inventor
Eroi Jiyannfuransowa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of JPS55143520A publication Critical patent/JPS55143520A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Lasers (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
  • Electron Tubes For Measurement (AREA)
  • Microscoopes, Condenser (AREA)
JP4951180A 1979-04-18 1980-04-15 Adjustment of optical beam impinge on target and device therefor Pending JPS55143520A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7909763A FR2454635A1 (fr) 1979-04-18 1979-04-18 Procede et dispositif de reglage de l'impact sur une cible d'un faisceau de lumiere monochromatique emis par une source laser

Publications (1)

Publication Number Publication Date
JPS55143520A true JPS55143520A (en) 1980-11-08

Family

ID=9224435

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4951180A Pending JPS55143520A (en) 1979-04-18 1980-04-15 Adjustment of optical beam impinge on target and device therefor

Country Status (5)

Country Link
US (1) US4330208A (enExample)
EP (1) EP0018288B1 (enExample)
JP (1) JPS55143520A (enExample)
DE (1) DE3061984D1 (enExample)
FR (1) FR2454635A1 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62219450A (ja) * 1986-03-20 1987-09-26 Matsushita Electric Works Ltd 質量分析装置
JPS62195774U (enExample) * 1986-06-03 1987-12-12
JPS63146339A (ja) * 1986-12-08 1988-06-18 Shimadzu Corp 飛行時間型質量分析計

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4439259A (en) * 1981-01-23 1984-03-27 Acton Research Corporation Method of making laser fusion debris shield
DE3125335A1 (de) * 1981-06-27 1983-01-13 Alfred Prof. Dr. 4400 Münster Benninghoven Verfahren zur analyse von gasen und fluessigkeiten
US4494881A (en) * 1982-03-10 1985-01-22 Everest Charles E Intra-optical light beam sighting system for an infrared thermometer
US4520388A (en) * 1982-11-01 1985-05-28 General Electric Company Optical signal projector
US4633084A (en) * 1985-01-16 1986-12-30 The United States Of America As Represented By The United States Department Of Energy High efficiency direct detection of ions from resonance ionization of sputtered atoms
US4667101A (en) * 1985-02-04 1987-05-19 The United States Of America As Respresented By The United States Department Of Energy Predicting threshold and location of laser damage on optical surfaces
GB2177507B (en) * 1985-06-13 1989-02-15 Mitsubishi Electric Corp Laser mass spectroscopic analyzer
FR2608484B1 (fr) * 1986-12-23 1989-04-28 Bertin & Cie Machine a microfaisceau laser d'intervention sur des objets a couches minces de materiau
USH687H (en) 1989-04-17 1989-10-03 The United States Of America As Represented By The Secretary Of The Navy Video microimaging system
GB2236186B (en) * 1989-08-22 1994-01-05 Finnigan Mat Gmbh Process and device for laser desorption of analyte molecular ions, especially of biomolecules
US5545160A (en) * 1990-08-14 1996-08-13 O'rourke; Daniel K. Computer oriented stereotactic microneurological surgery
US5498545A (en) * 1994-07-21 1996-03-12 Vestal; Marvin L. Mass spectrometer system and method for matrix-assisted laser desorption measurements
USRE39353E1 (en) * 1994-07-21 2006-10-17 Applera Corporation Mass spectrometer system and method for matrix-assisted laser desorption measurements
US6002127A (en) 1995-05-19 1999-12-14 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5625184A (en) * 1995-05-19 1997-04-29 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US6191382B1 (en) 1998-04-02 2001-02-20 Avery Dennison Corporation Dynamic laser cutting apparatus
DE19957418B4 (de) * 1999-11-29 2016-02-04 Leica Microsystems Cms Gmbh Verfahren zur lichtoptischen Abtastung eines Objekts und Rastermikroskop zur Anwendung des Verfahrens
US6836329B1 (en) * 2003-07-09 2004-12-28 International Business Machines Corporation Real time IR optical sensor
US7460225B2 (en) * 2004-03-05 2008-12-02 Vassili Karanassios Miniaturized source devices for optical and mass spectrometry
FR2941529A1 (fr) * 2009-01-26 2010-07-30 Univ Claude Bernard Lyon Unite d'excitation lumineuse d'un echantillon et de collection de la lumiere emise par ledit echantillon excite
US20120057172A1 (en) * 2010-09-08 2012-03-08 Andrei Brunfeld Optical measuring system with illumination provided through a void in a collecting lens
FR2996000B1 (fr) 2012-09-25 2014-10-17 Univ Claude Bernard Lyon Installation de mesures spectroscopiques a partir d'un plasma induit par laser
CN106568762B (zh) 2016-11-07 2019-08-06 中国科学院光电研究院 扫描式激光诱导光谱面范围分析检测系统
CN114166122B (zh) * 2021-12-02 2023-08-01 中国工程物理研究院流体物理研究所 一种自动调靶装置
FR3143754B1 (fr) * 2022-12-20 2025-12-12 Fariaut Instr Procédé de réglage d’un système d’analyse d’un échantillon par faisceau laser

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3710788A (en) * 1971-07-23 1973-01-16 W Reeves Eyelid support for invalids
US3710798A (en) * 1971-08-30 1973-01-16 American Optical Corp Laser system for microsurgery
US3782823A (en) * 1972-03-23 1974-01-01 American Optical Corp Laser microprobe
US3892488A (en) * 1974-02-22 1975-07-01 Us Air Force Laser site marking system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62219450A (ja) * 1986-03-20 1987-09-26 Matsushita Electric Works Ltd 質量分析装置
JPS62195774U (enExample) * 1986-06-03 1987-12-12
JPS63146339A (ja) * 1986-12-08 1988-06-18 Shimadzu Corp 飛行時間型質量分析計

Also Published As

Publication number Publication date
DE3061984D1 (en) 1983-03-24
EP0018288B1 (fr) 1983-02-16
FR2454635B1 (enExample) 1983-08-05
FR2454635A1 (fr) 1980-11-14
US4330208A (en) 1982-05-18
EP0018288A1 (fr) 1980-10-29

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