JPS55120258A - Malfunction preventing method of automatic switching testing device - Google Patents

Malfunction preventing method of automatic switching testing device

Info

Publication number
JPS55120258A
JPS55120258A JP2707879A JP2707879A JPS55120258A JP S55120258 A JPS55120258 A JP S55120258A JP 2707879 A JP2707879 A JP 2707879A JP 2707879 A JP2707879 A JP 2707879A JP S55120258 A JPS55120258 A JP S55120258A
Authority
JP
Japan
Prior art keywords
epbx
cmt
tape
kinds
information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2707879A
Other languages
Japanese (ja)
Inventor
Hiroaki Bando
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP2707879A priority Critical patent/JPS55120258A/en
Publication of JPS55120258A publication Critical patent/JPS55120258A/en
Pending legal-status Critical Current

Links

Landscapes

  • Monitoring And Testing Of Exchanges (AREA)

Abstract

PURPOSE:To make it possible to prevent malfunction due to a selection error of a magnetic memory unit by collating information by kinds of equipments of an answer signal, sent from a connected switchboard, to that stored in the memory unit. CONSTITUTION:The CPU of testing device TE sends out a scan signal to connected EPBX. The CPU on the automatic switchboard EPBX side sends information by kinds of predetermined switchboards to the device TE side. Device TE receives the information by kinds of switchboard from EPBX and stores it in memory MEM. Next, tape CMT for EPBX to be tested is selected and loaded on device TE and a testing program is transferred from tape CMT to memory MEM of device TE. At this time, the CPU of device TE collates the information by kinds of switchboards on tape CMT with that having received and stored and when the both agree with each other, correct operation is carried out and when not, a check on whether it has been written at any other part of tape CMT or not is made, so that when it is not found, the lamp of device TE will come on indicating malfunction.
JP2707879A 1979-03-08 1979-03-08 Malfunction preventing method of automatic switching testing device Pending JPS55120258A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2707879A JPS55120258A (en) 1979-03-08 1979-03-08 Malfunction preventing method of automatic switching testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2707879A JPS55120258A (en) 1979-03-08 1979-03-08 Malfunction preventing method of automatic switching testing device

Publications (1)

Publication Number Publication Date
JPS55120258A true JPS55120258A (en) 1980-09-16

Family

ID=12211031

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2707879A Pending JPS55120258A (en) 1979-03-08 1979-03-08 Malfunction preventing method of automatic switching testing device

Country Status (1)

Country Link
JP (1) JPS55120258A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4940407A (en) * 1972-08-21 1974-04-16
JPS5393713A (en) * 1977-01-27 1978-08-17 Nec Corp Collating system for trunk number

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4940407A (en) * 1972-08-21 1974-04-16
JPS5393713A (en) * 1977-01-27 1978-08-17 Nec Corp Collating system for trunk number

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