JPS55116245A - Powder xxray diffraction meter - Google Patents

Powder xxray diffraction meter

Info

Publication number
JPS55116245A
JPS55116245A JP2105380A JP2105380A JPS55116245A JP S55116245 A JPS55116245 A JP S55116245A JP 2105380 A JP2105380 A JP 2105380A JP 2105380 A JP2105380 A JP 2105380A JP S55116245 A JPS55116245 A JP S55116245A
Authority
JP
Japan
Prior art keywords
xxray
powder
diffraction meter
diffraction
meter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2105380A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6345056B2 (enExample
Inventor
Geeberu Heruberuto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Corp
Original Assignee
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Corp filed Critical Siemens Corp
Publication of JPS55116245A publication Critical patent/JPS55116245A/ja
Publication of JPS6345056B2 publication Critical patent/JPS6345056B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2105380A 1979-02-23 1980-02-21 Powder xxray diffraction meter Granted JPS55116245A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2907160A DE2907160C2 (de) 1979-02-23 1979-02-23 Röntgen-Pulverdiffraktometer

Publications (2)

Publication Number Publication Date
JPS55116245A true JPS55116245A (en) 1980-09-06
JPS6345056B2 JPS6345056B2 (enExample) 1988-09-07

Family

ID=6063785

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2105380A Granted JPS55116245A (en) 1979-02-23 1980-02-21 Powder xxray diffraction meter

Country Status (4)

Country Link
US (1) US4274000A (enExample)
JP (1) JPS55116245A (enExample)
DE (1) DE2907160C2 (enExample)
NL (1) NL8001096A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59153153A (ja) * 1983-02-04 1984-09-01 エヌ・ベ−・フイリップス・フル−イランペンファブリケン Ｘ線分析装置
JPH01214747A (ja) * 1988-02-24 1989-08-29 Mc Sci:Kk Ｘ線回折装置
JPH01295146A (ja) * 1988-05-21 1989-11-28 Mc Sci:Kk Ｘ線回折装置

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3021585A1 (de) * 1980-06-09 1981-12-24 Siemens AG, 1000 Berlin und 8000 München Roentgeneinstrukturanalysegeraet mit probenwechsler und ortsempfindlichem dektektor
DE3125803A1 (de) * 1981-06-30 1983-01-13 Siemens AG, 1000 Berlin und 8000 München Kristall-roentgen-sequenzspektrometer
US5373544A (en) * 1992-08-12 1994-12-13 Siemens Aktiengesellschaft X-ray diffractometer
DE69403129T2 (de) * 1993-03-25 1997-08-28 Seiko Instr Inc Röntgenstrahlen-Analysegerät
US6269144B1 (en) 1998-03-04 2001-07-31 William P. Dube Method and apparatus for diffraction measurement using a scanning x-ray source
US6870896B2 (en) 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
US6804324B2 (en) * 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
DE10141958B4 (de) * 2001-08-28 2006-06-08 Bruker Axs Gmbh Röntgen-Diffraktometer
EP1571441A1 (en) * 2004-03-01 2005-09-07 Panalytical B.V. Monitoring epitaxial growth in situ by means of an angle dispersive X-ray diffractometer
WO2011002037A1 (ja) 2009-07-01 2011-01-06 株式会社リガク Ｘ線装置、その使用方法およびｘ線照射方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1247670A (en) * 1967-11-29 1971-09-29 Nat Res Dev Spectrometers
SE322066B (enExample) * 1968-01-25 1970-03-23 Incentive Res & Dev Ab
US3852594A (en) * 1973-07-25 1974-12-03 Pepi Inc X-ray diffraction apparatus
DE2637945C3 (de) * 1976-08-23 1979-02-08 Siemens Ag, 1000 Berlin Und 8000 Muenchen Roentgen-pulverdiffraktometer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59153153A (ja) * 1983-02-04 1984-09-01 エヌ・ベ−・フイリップス・フル−イランペンファブリケン Ｘ線分析装置
JPH01214747A (ja) * 1988-02-24 1989-08-29 Mc Sci:Kk Ｘ線回折装置
JPH01295146A (ja) * 1988-05-21 1989-11-28 Mc Sci:Kk Ｘ線回折装置

Also Published As

Publication number Publication date
JPS6345056B2 (enExample) 1988-09-07
DE2907160C2 (de) 1986-09-25
DE2907160A1 (de) 1980-09-04
US4274000A (en) 1981-06-16
NL8001096A (nl) 1980-08-26

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