JPS55108981U - - Google Patents
Info
- Publication number
- JPS55108981U JPS55108981U JP875879U JP875879U JPS55108981U JP S55108981 U JPS55108981 U JP S55108981U JP 875879 U JP875879 U JP 875879U JP 875879 U JP875879 U JP 875879U JP S55108981 U JPS55108981 U JP S55108981U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP875879U JPS55108981U (en) | 1979-01-25 | 1979-01-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP875879U JPS55108981U (en) | 1979-01-25 | 1979-01-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS55108981U true JPS55108981U (en) | 1980-07-30 |
Family
ID=28818327
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP875879U Pending JPS55108981U (en) | 1979-01-25 | 1979-01-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55108981U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010107432A (en) * | 2008-10-31 | 2010-05-13 | Fuji Electric Systems Co Ltd | Method of integrated test of semiconductor and semiconductor testing device |
-
1979
- 1979-01-25 JP JP875879U patent/JPS55108981U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010107432A (en) * | 2008-10-31 | 2010-05-13 | Fuji Electric Systems Co Ltd | Method of integrated test of semiconductor and semiconductor testing device |