JPS5498268A - Method of inspecting position - Google Patents

Method of inspecting position

Info

Publication number
JPS5498268A
JPS5498268A JP15378478A JP15378478A JPS5498268A JP S5498268 A JPS5498268 A JP S5498268A JP 15378478 A JP15378478 A JP 15378478A JP 15378478 A JP15378478 A JP 15378478A JP S5498268 A JPS5498268 A JP S5498268A
Authority
JP
Japan
Prior art keywords
inspecting position
inspecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15378478A
Other languages
English (en)
Other versions
JPH0220921B2 (ja
Inventor
Yuujin Deebisu Donarudo
Bikutaa Uiiba Edowaado
Kaaman Uiriamuzu Moorisu
Kurifuton Utsudaado Orii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS5498268A publication Critical patent/JPS5498268A/ja
Publication of JPH0220921B2 publication Critical patent/JPH0220921B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • H01J37/3045—Object or beam position registration

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Drying Of Semiconductors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP15378478A 1978-01-16 1978-12-14 Method of inspecting position Granted JPS5498268A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/869,972 US4149085A (en) 1978-01-16 1978-01-16 Automatic overlay measurements using an electronic beam system as a measurement tool

Publications (2)

Publication Number Publication Date
JPS5498268A true JPS5498268A (en) 1979-08-03
JPH0220921B2 JPH0220921B2 (ja) 1990-05-11

Family

ID=25354531

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15378478A Granted JPS5498268A (en) 1978-01-16 1978-12-14 Method of inspecting position

Country Status (4)

Country Link
US (1) US4149085A (ja)
EP (1) EP0003038B1 (ja)
JP (1) JPS5498268A (ja)
DE (1) DE2860511D1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5795627A (en) * 1980-12-05 1982-06-14 Nippon Telegr & Teleph Corp <Ntt> Method for arranging mark in electron beam exposure
JPS59163506A (ja) * 1983-03-09 1984-09-14 Hitachi Ltd 電子ビ−ム測長装置
JPS62150717A (ja) * 1985-12-24 1987-07-04 Mitsubishi Electric Corp 微細パタ−ン形成方法
JPS63269007A (ja) * 1987-04-10 1988-11-07 エテック・システムズ・インコーポレイテッド サブストレートの位置測定用検出器

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2937136A1 (de) * 1979-09-13 1981-04-02 Siemens AG, 1000 Berlin und 8000 München Verfahren und vorrichtung zur schnellen ablenkung eines korpuskularstrahls
US4357540A (en) * 1980-12-19 1982-11-02 International Business Machines Corporation Semiconductor device array mask inspection method and apparatus
US4417203A (en) * 1981-05-26 1983-11-22 International Business Machines Corporation System for contactless electrical property testing of multi-layer ceramics
US4415851A (en) * 1981-05-26 1983-11-15 International Business Machines Corporation System for contactless testing of multi-layer ceramics
JPS57212754A (en) * 1981-06-24 1982-12-27 Hitachi Ltd Electron-beam controller for electron microscope
JPH11325877A (ja) * 1998-03-31 1999-11-26 Siemens Ag 測定誤差を減少させるための方法及び装置
US6926524B2 (en) * 1999-09-24 2005-08-09 Cao Group, Inc. Curing light
US6362491B1 (en) 1999-10-01 2002-03-26 Taiwan Semiconductor Manufacturing Company Method of overlay measurement in both X and Y directions for photo stitch process
KR20010088997A (ko) * 2001-08-31 2001-09-29 윤종태 반도체 공정에서 중첩도 측정 방법
US7379184B2 (en) * 2004-10-18 2008-05-27 Nanometrics Incorporated Overlay measurement target
US7808643B2 (en) * 2005-02-25 2010-10-05 Nanometrics Incorporated Determining overlay error using an in-chip overlay target
WO2006093722A2 (en) * 2005-02-25 2006-09-08 Accent Optical Technologies, Inc. Methods and systems for determining overlay error based on target image symmetry
JP6118505B2 (ja) * 2012-04-04 2017-04-19 株式会社日立ハイテクノロジーズ 位置ずれ計測装置及び位置ずれ計測方法ならびに位置ずれ計測装置を用いた走査電子顕微鏡
KR102234659B1 (ko) 2013-10-29 2021-04-05 삼성전자주식회사 고에너지 전자 빔을 이용하여 인-셀 오버레이 오프셋을 측정할 수 있는 sem 장치와 그 방법

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5160455A (ja) * 1974-11-22 1976-05-26 Tokyo Shibaura Electric Co
JPS51148451A (en) * 1975-06-14 1976-12-20 Fujitsu Ltd Basic position-error detection system

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1533755A (fr) * 1966-08-16 1968-07-19 Jeol Ltd Dispositif pour le réglage du point de traitement dans un appareil à faisceau électrique ou analogue
US3644700A (en) * 1969-12-15 1972-02-22 Ibm Method and apparatus for controlling an electron beam
US3875416A (en) * 1970-06-30 1975-04-01 Texas Instruments Inc Methods and apparatus for the production of semiconductor devices by electron-beam patterning and devices produced thereby
US3875414A (en) * 1973-08-20 1975-04-01 Secr Defence Brit Methods suitable for use in or in connection with the production of microelectronic devices
DE2424315C3 (de) * 1974-05-18 1978-08-24 Marbach, Walter, Bern Einrichtung zur Umwandlung von Sonnenenergie in mechanische Energie
US4056730A (en) * 1976-07-12 1977-11-01 International Business Machines Corporation Apparatus for detecting registration marks on a target such as a semiconductor wafer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5160455A (ja) * 1974-11-22 1976-05-26 Tokyo Shibaura Electric Co
JPS51148451A (en) * 1975-06-14 1976-12-20 Fujitsu Ltd Basic position-error detection system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5795627A (en) * 1980-12-05 1982-06-14 Nippon Telegr & Teleph Corp <Ntt> Method for arranging mark in electron beam exposure
JPS59163506A (ja) * 1983-03-09 1984-09-14 Hitachi Ltd 電子ビ−ム測長装置
JPH0349042B2 (ja) * 1983-03-09 1991-07-26 Hitachi Ltd
JPS62150717A (ja) * 1985-12-24 1987-07-04 Mitsubishi Electric Corp 微細パタ−ン形成方法
JPS63269007A (ja) * 1987-04-10 1988-11-07 エテック・システムズ・インコーポレイテッド サブストレートの位置測定用検出器

Also Published As

Publication number Publication date
DE2860511D1 (en) 1981-04-02
JPH0220921B2 (ja) 1990-05-11
EP0003038A2 (de) 1979-07-25
EP0003038A3 (en) 1979-08-08
EP0003038B1 (de) 1981-02-25
US4149085A (en) 1979-04-10

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