JPS5448176A - Test method for semiconductor integrated circuit - Google Patents
Test method for semiconductor integrated circuitInfo
- Publication number
- JPS5448176A JPS5448176A JP11486177A JP11486177A JPS5448176A JP S5448176 A JPS5448176 A JP S5448176A JP 11486177 A JP11486177 A JP 11486177A JP 11486177 A JP11486177 A JP 11486177A JP S5448176 A JPS5448176 A JP S5448176A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- supplied
- comparator
- relay
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To realize a test method for IC which can carry out the IC test independently from the function test and can reduce the test time.
CONSTITUTION: When the fault is detected for electrode terminal 16 amoun terminals 1W16 contained in IC container 20, relay K1 is actuated and terminal 16 is connected to comparator CM1 of comparator circuit 50 via contact 1a and 1b of relay K1 plus detection lead MS1. Other relays K2WK16 have no actuation, and terminals 1W15 are connected to the ground of power source 30 via relay contacts 2aW16a. and comparators CM2WCM16 are connected to VCC of power source 30 via contacts 2bW16b. As a result, detection output VX is produced at terminal 16 and then compared with comparison reference voltage Vr through CM1. The output of the comparator is supplied to OR circuit 60. In case voltage VX is lower than Vr, the defective signal is supplied to circuit 60. Accordingly, the defective signal is produced to the output and supplied to display circuit 70 to display the result
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11486177A JPS5448176A (en) | 1977-09-22 | 1977-09-22 | Test method for semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11486177A JPS5448176A (en) | 1977-09-22 | 1977-09-22 | Test method for semiconductor integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5448176A true JPS5448176A (en) | 1979-04-16 |
Family
ID=14648524
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11486177A Pending JPS5448176A (en) | 1977-09-22 | 1977-09-22 | Test method for semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5448176A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6371669A (en) * | 1986-09-16 | 1988-04-01 | Matsushita Electronics Corp | Inspecting method for electronic circuit device |
US6075377A (en) * | 1996-05-28 | 2000-06-13 | Nec Corporation | Method of confirming connecting states of signal terminals in a semiconductor device |
-
1977
- 1977-09-22 JP JP11486177A patent/JPS5448176A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6371669A (en) * | 1986-09-16 | 1988-04-01 | Matsushita Electronics Corp | Inspecting method for electronic circuit device |
US6075377A (en) * | 1996-05-28 | 2000-06-13 | Nec Corporation | Method of confirming connecting states of signal terminals in a semiconductor device |
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