JPS5428090B2 - - Google Patents
Info
- Publication number
- JPS5428090B2 JPS5428090B2 JP12744874A JP12744874A JPS5428090B2 JP S5428090 B2 JPS5428090 B2 JP S5428090B2 JP 12744874 A JP12744874 A JP 12744874A JP 12744874 A JP12744874 A JP 12744874A JP S5428090 B2 JPS5428090 B2 JP S5428090B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19732355185 DE2355185C2 (de) | 1973-11-05 | 1973-11-05 | Anordnung zur Dickenmessung von Gegenständen unter Verwendung von Laserstrahlen |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5080155A JPS5080155A (enExample) | 1975-06-30 |
| JPS5428090B2 true JPS5428090B2 (enExample) | 1979-09-13 |
Family
ID=5897224
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12744874A Expired JPS5428090B2 (enExample) | 1973-11-05 | 1974-11-05 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPS5428090B2 (enExample) |
| DE (1) | DE2355185C2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5647701A (en) * | 1979-09-27 | 1981-04-30 | Canon Inc | Detector for incident location of light flux |
| DE3204086A1 (de) * | 1982-02-06 | 1983-08-11 | Ibm Deutschland Gmbh, 7000 Stuttgart | Vorrichtung zur automatischen optischen beschaffenheitspruefung |
| JPS626106A (ja) * | 1985-07-03 | 1987-01-13 | Kazuo Shimada | 厚さ測定方法および測定装置 |
| EP0248479B1 (en) * | 1986-06-04 | 1991-11-27 | Koninklijke Philips Electronics N.V. | Arrangement for optically measuring a distance between a surface and a reference plane |
| DE3728705A1 (de) * | 1987-08-28 | 1989-03-09 | Agfa Gevaert Ag | Vorrichtung zur ueberpruefung von beschichteten und unbeschichteten folien |
| DE3728704A1 (de) * | 1987-08-28 | 1989-03-09 | Agfa Gevaert Ag | Vorrichtung zur bestimmung der dicke von schichttraegern |
-
1973
- 1973-11-05 DE DE19732355185 patent/DE2355185C2/de not_active Expired
-
1974
- 1974-11-05 JP JP12744874A patent/JPS5428090B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE2355185B1 (de) | 1974-10-10 |
| DE2355185C2 (de) | 1975-05-22 |
| JPS5080155A (enExample) | 1975-06-30 |