JPS5424316B2 - - Google Patents
Info
- Publication number
- JPS5424316B2 JPS5424316B2 JP7702476A JP7702476A JPS5424316B2 JP S5424316 B2 JPS5424316 B2 JP S5424316B2 JP 7702476 A JP7702476 A JP 7702476A JP 7702476 A JP7702476 A JP 7702476A JP S5424316 B2 JPS5424316 B2 JP S5424316B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7702476A JPS533884A (en) | 1976-07-01 | 1976-07-01 | Stress measuring apparatus x-ray |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7702476A JPS533884A (en) | 1976-07-01 | 1976-07-01 | Stress measuring apparatus x-ray |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS533884A JPS533884A (en) | 1978-01-13 |
| JPS5424316B2 true JPS5424316B2 (en) | 1979-08-20 |
Family
ID=13622171
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7702476A Granted JPS533884A (en) | 1976-07-01 | 1976-07-01 | Stress measuring apparatus x-ray |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS533884A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6394513B2 (en) * | 2015-06-18 | 2018-09-26 | 新東工業株式会社 | Residual stress measuring device and residual stress measuring method |
| CN110542506A (en) * | 2019-10-16 | 2019-12-06 | 丹东浩元仪器有限公司 | detection device and detection method for X-ray stress determinator |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3051834A (en) * | 1959-09-16 | 1962-08-28 | Shimula Yoshihiro | Automatic recording system of x-ray diffraction patterns |
-
1976
- 1976-07-01 JP JP7702476A patent/JPS533884A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3051834A (en) * | 1959-09-16 | 1962-08-28 | Shimula Yoshihiro | Automatic recording system of x-ray diffraction patterns |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS533884A (en) | 1978-01-13 |