JPS54183284U - - Google Patents

Info

Publication number
JPS54183284U
JPS54183284U JP8126078U JP8126078U JPS54183284U JP S54183284 U JPS54183284 U JP S54183284U JP 8126078 U JP8126078 U JP 8126078U JP 8126078 U JP8126078 U JP 8126078U JP S54183284 U JPS54183284 U JP S54183284U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8126078U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8126078U priority Critical patent/JPS54183284U/ja
Publication of JPS54183284U publication Critical patent/JPS54183284U/ja
Pending legal-status Critical Current

Links

JP8126078U 1978-06-14 1978-06-14 Pending JPS54183284U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8126078U JPS54183284U (en) 1978-06-14 1978-06-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8126078U JPS54183284U (en) 1978-06-14 1978-06-14

Publications (1)

Publication Number Publication Date
JPS54183284U true JPS54183284U (en) 1979-12-26

Family

ID=29000940

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8126078U Pending JPS54183284U (en) 1978-06-14 1978-06-14

Country Status (1)

Country Link
JP (1) JPS54183284U (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60213040A (en) * 1984-04-09 1985-10-25 Hitachi Ltd Wafer prober
JPS63108737A (en) * 1986-10-27 1988-05-13 Mitsubishi Electric Corp Wafer prober
JPS63212879A (en) * 1987-02-28 1988-09-05 Nec Corp Apparatus for measuring semiconductive photo detector
JPH01161174A (en) * 1987-12-17 1989-06-23 Tokyo Electron Ltd Probe device
JPH0228344A (en) * 1988-07-18 1990-01-30 Tokyo Electron Ltd Semiconductor inspection apparatus
JPH07110364A (en) * 1994-03-28 1995-04-25 Tokyo Electron Ltd Apparatus and method for probing
JP2016178189A (en) * 2015-03-19 2016-10-06 三菱電機株式会社 Marking apparatus and marking method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5197372A (en) * 1975-02-24 1976-08-26
JPS51102467A (en) * 1975-03-05 1976-09-09 Nippon Electric Co

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5197372A (en) * 1975-02-24 1976-08-26
JPS51102467A (en) * 1975-03-05 1976-09-09 Nippon Electric Co

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60213040A (en) * 1984-04-09 1985-10-25 Hitachi Ltd Wafer prober
JPS63108737A (en) * 1986-10-27 1988-05-13 Mitsubishi Electric Corp Wafer prober
JPS63212879A (en) * 1987-02-28 1988-09-05 Nec Corp Apparatus for measuring semiconductive photo detector
JPH01161174A (en) * 1987-12-17 1989-06-23 Tokyo Electron Ltd Probe device
JPH0228344A (en) * 1988-07-18 1990-01-30 Tokyo Electron Ltd Semiconductor inspection apparatus
JPH07110364A (en) * 1994-03-28 1995-04-25 Tokyo Electron Ltd Apparatus and method for probing
JP2016178189A (en) * 2015-03-19 2016-10-06 三菱電機株式会社 Marking apparatus and marking method

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