JPS54158984A - Xxray fluoroscopic inspection apparatus - Google Patents

Xxray fluoroscopic inspection apparatus

Info

Publication number
JPS54158984A
JPS54158984A JP6727778A JP6727778A JPS54158984A JP S54158984 A JPS54158984 A JP S54158984A JP 6727778 A JP6727778 A JP 6727778A JP 6727778 A JP6727778 A JP 6727778A JP S54158984 A JPS54158984 A JP S54158984A
Authority
JP
Japan
Prior art keywords
ray
camera
rays
picked
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6727778A
Other languages
Japanese (ja)
Other versions
JPS5953500B2 (en
Inventor
Masaji Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP53067277A priority Critical patent/JPS5953500B2/en
Publication of JPS54158984A publication Critical patent/JPS54158984A/en
Publication of JPS5953500B2 publication Critical patent/JPS5953500B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

PURPOSE:To make possible displaying of X-ray fluoroscopic image and appearance with one unit of viedo monitor by picking up the two sets of light by a half mirror which transmits X-rays and reflects visible light with an X-ray TV, ITVT camera. CONSTITUTION:X-rays from an X-ray source 1 transmit through a half mirror 7 and the object to be inspected 2 and the transmitted X-rays are picked up in an X- ray TV camera 4. On the other hand, the visible rays from the object to be examined 2 reflect on the mirror 7 and are picked up by an IVT camera 8. When the image picked up signals of these cameras 4, 8 are processed by a signal processing means 9 with the synchronizing signal of the camera 4 as a reference and are applied to a video monitor 6 via mixer or changeover device, then the X-ray image and the apperance of the object to be examined of that portion may be displayed simultaneously or selectively.
JP53067277A 1978-06-06 1978-06-06 X-ray fluoroscopy equipment Expired JPS5953500B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53067277A JPS5953500B2 (en) 1978-06-06 1978-06-06 X-ray fluoroscopy equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53067277A JPS5953500B2 (en) 1978-06-06 1978-06-06 X-ray fluoroscopy equipment

Publications (2)

Publication Number Publication Date
JPS54158984A true JPS54158984A (en) 1979-12-15
JPS5953500B2 JPS5953500B2 (en) 1984-12-25

Family

ID=13340303

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53067277A Expired JPS5953500B2 (en) 1978-06-06 1978-06-06 X-ray fluoroscopy equipment

Country Status (1)

Country Link
JP (1) JPS5953500B2 (en)

Cited By (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59130706U (en) * 1983-02-21 1984-09-01 有限会社友信開発 Medical X-ray fluoroscopy equipment
US4562464A (en) * 1982-01-08 1985-12-31 Tokyo Shibaura Denki Kabushiki Kaisha X-Ray diagnostic apparatus
US4995068A (en) * 1989-10-02 1991-02-19 S&S Inficon, Inc. Radiation therapy imaging apparatus
JPH03160352A (en) * 1989-11-18 1991-07-10 Shimadzu Corp Device for displaying sample image
US5590170A (en) * 1993-04-12 1996-12-31 Glenbrook Technologies X-ray inspection system
US5774269A (en) * 1995-03-21 1998-06-30 U.S. Philips Corporation Image pick-up apparatus
JPH1141519A (en) * 1997-07-17 1999-02-12 Shimadzu Corp X-ray radioscope device
US6009145A (en) * 1998-02-11 1999-12-28 Glenbrook Technologies Inc. Ball grid array re-work assembly with X-ray inspection system
US6151380A (en) * 1998-02-11 2000-11-21 Glenbrook Technologies Inc. Ball grid array re-work assembly with X-ray inspection system
US6229873B1 (en) * 1999-09-30 2001-05-08 Siemens Corporate Research, Inc Method for aligning an apparatus for superimposing X-ray and video images
JP2001149362A (en) * 1999-09-30 2001-06-05 Siemens Corporate Res Inc Alignment method and alignment device for superimposing x-ray image and video image
JP2004283258A (en) * 2003-03-19 2004-10-14 Fuji Photo Film Co Ltd Radiographic imaging system
DE10049103B4 (en) * 1999-09-30 2005-01-27 Siemens Corp. Research, Inc. Device for overlaying X-ray and video images
JP2005181242A (en) * 2003-12-24 2005-07-07 Shimadzu Corp Fluoroscope
JP2007198740A (en) * 2006-01-23 2007-08-09 Shimadzu Corp X-ray inspection system
US7705267B2 (en) * 2005-06-30 2010-04-27 Jon Heyl Semiconductor failure analysis tool
US7726879B2 (en) 2007-10-23 2010-06-01 Canon Kabushiki Kaisha X-ray imaging apparatus, control method for x-ray imaging apparatus, program, and storage medium
US7841772B2 (en) 2007-11-28 2010-11-30 Canon Kabushiki Kaisha Imaging apparatus
WO2013063829A1 (en) * 2011-11-01 2013-05-10 Gai Boqing C-arm x-ray fluoroscopic machine and dedicated camera mechanism
US9541499B2 (en) 2012-10-17 2017-01-10 System Square Inc. Package inspection system
EP3045897B1 (en) 2013-10-03 2019-07-03 System Square Inc. Package inspection device

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06281598A (en) * 1991-07-26 1994-10-07 Motoronikusu:Kk Apparatus and method for simultaneously displaying x-ray image and optical image of multilayered work
JP3203766B2 (en) * 1992-05-15 2001-08-27 ソニー株式会社 X-ray positioning confirmation method, X-ray positioning confirmation / positioning method, and X-ray inspection device
JP2018128401A (en) * 2017-02-10 2018-08-16 東芝Ｉｔコントロールシステム株式会社 X-ray fluoroscopic inspection apparatus

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4562464A (en) * 1982-01-08 1985-12-31 Tokyo Shibaura Denki Kabushiki Kaisha X-Ray diagnostic apparatus
JPS59130706U (en) * 1983-02-21 1984-09-01 有限会社友信開発 Medical X-ray fluoroscopy equipment
US4995068A (en) * 1989-10-02 1991-02-19 S&S Inficon, Inc. Radiation therapy imaging apparatus
JPH03160352A (en) * 1989-11-18 1991-07-10 Shimadzu Corp Device for displaying sample image
US5590170A (en) * 1993-04-12 1996-12-31 Glenbrook Technologies X-ray inspection system
US5774269A (en) * 1995-03-21 1998-06-30 U.S. Philips Corporation Image pick-up apparatus
JPH1141519A (en) * 1997-07-17 1999-02-12 Shimadzu Corp X-ray radioscope device
US6009145A (en) * 1998-02-11 1999-12-28 Glenbrook Technologies Inc. Ball grid array re-work assembly with X-ray inspection system
US6151380A (en) * 1998-02-11 2000-11-21 Glenbrook Technologies Inc. Ball grid array re-work assembly with X-ray inspection system
JP2001149362A (en) * 1999-09-30 2001-06-05 Siemens Corporate Res Inc Alignment method and alignment device for superimposing x-ray image and video image
US6229873B1 (en) * 1999-09-30 2001-05-08 Siemens Corporate Research, Inc Method for aligning an apparatus for superimposing X-ray and video images
US6473489B2 (en) * 1999-09-30 2002-10-29 Siemens Corporate Research, Inc Apparatus for superimposition of X-ray and video images
DE10049103B4 (en) * 1999-09-30 2005-01-27 Siemens Corp. Research, Inc. Device for overlaying X-ray and video images
JP2004283258A (en) * 2003-03-19 2004-10-14 Fuji Photo Film Co Ltd Radiographic imaging system
JP2005181242A (en) * 2003-12-24 2005-07-07 Shimadzu Corp Fluoroscope
US7705267B2 (en) * 2005-06-30 2010-04-27 Jon Heyl Semiconductor failure analysis tool
JP2007198740A (en) * 2006-01-23 2007-08-09 Shimadzu Corp X-ray inspection system
JP4665774B2 (en) * 2006-01-23 2011-04-06 株式会社島津製作所 X-ray inspection equipment
US7726879B2 (en) 2007-10-23 2010-06-01 Canon Kabushiki Kaisha X-ray imaging apparatus, control method for x-ray imaging apparatus, program, and storage medium
US7841772B2 (en) 2007-11-28 2010-11-30 Canon Kabushiki Kaisha Imaging apparatus
WO2013063829A1 (en) * 2011-11-01 2013-05-10 Gai Boqing C-arm x-ray fluoroscopic machine and dedicated camera mechanism
US9541499B2 (en) 2012-10-17 2017-01-10 System Square Inc. Package inspection system
EP3045897B1 (en) 2013-10-03 2019-07-03 System Square Inc. Package inspection device

Also Published As

Publication number Publication date
JPS5953500B2 (en) 1984-12-25

Similar Documents

Publication Publication Date Title
JPS54158984A (en) Xxray fluoroscopic inspection apparatus
JPS5542624A (en) Automatic eye refraction measuring system
JPS55124117A (en) Pattern inspecting apparatus
GB2292458A (en) Ultrasound imaging method and apparatus with dynamic non-linear filtering
KR840008992A (en) Invited microscope
JPS56117154A (en) Inspecting apparatus of flaw
ES2044790A6 (en) Imaging system for providing multiple simultaneous real time images
JPS5737993A (en) Stereoscopic television system
JPS5412623A (en) X-ray video display system
JPS5729040A (en) Adapter for photographing
JPS57165746A (en) Pickup device for tomographic image by picture processing of x-ray diffraction image
JPS53117928A (en) Automatic measuring device for television screen
JPS6453692A (en) Stereoscopic viewing device for x-ray perspective image
JPS56107183A (en) Radiant-type tomograph
JPS56103359A (en) Xxray fluoroscopic inspecting apparatus
JPS6482497A (en) X-ray automatic exposing device
JPS557724A (en) X-ray radiographic apparatus
FR2386833A1 (en) Viewing screen for X=ray images - has two perpendicular polarisation filters between which image is inserted and uniform light source
JPS53116729A (en) Video unit
JPS5627623A (en) Measurement of temperature distribution
JPS5623084A (en) X-ray television unit
JPS5673988A (en) X-ray television device
JPS6478079A (en) Solid-state image pickup device camera whose head part and signal control part are separated by cable
JPS5624890A (en) Corrective recording device for picture signal
JPS55109902A (en) Oblique image pickup correction system of subject size measuring instrument