JPS54154341A - Optical monitor - Google Patents

Optical monitor

Info

Publication number
JPS54154341A
JPS54154341A JP2148879A JP2148879A JPS54154341A JP S54154341 A JPS54154341 A JP S54154341A JP 2148879 A JP2148879 A JP 2148879A JP 2148879 A JP2148879 A JP 2148879A JP S54154341 A JPS54154341 A JP S54154341A
Authority
JP
Japan
Prior art keywords
optical monitor
monitor
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2148879A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6234097B2 (en, 2012
Inventor
Shitsuku Eruin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Erwin Sick GmbH Optik Elektronik
Original Assignee
Erwin Sick GmbH Optik Elektronik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Erwin Sick GmbH Optik Elektronik filed Critical Erwin Sick GmbH Optik Elektronik
Publication of JPS54154341A publication Critical patent/JPS54154341A/ja
Publication of JPS6234097B2 publication Critical patent/JPS6234097B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • G01N21/8903Optical details; Scanning details using a multiple detector array

Landscapes

  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2148879A 1978-02-27 1979-02-27 Optical monitor Granted JPS54154341A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2808360A DE2808360C3 (de) 1978-02-27 1978-02-27 Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels

Publications (2)

Publication Number Publication Date
JPS54154341A true JPS54154341A (en) 1979-12-05
JPS6234097B2 JPS6234097B2 (en, 2012) 1987-07-24

Family

ID=6033042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2148879A Granted JPS54154341A (en) 1978-02-27 1979-02-27 Optical monitor

Country Status (5)

Country Link
US (1) US4227091A (en, 2012)
JP (1) JPS54154341A (en, 2012)
DE (1) DE2808360C3 (en, 2012)
GB (1) GB2015728B (en, 2012)
SE (1) SE434780B (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6275236A (ja) * 1985-09-30 1987-04-07 Toshiba Corp 表面検査装置

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3000352C2 (de) * 1980-01-07 1986-07-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optoelektronisches Überwachungsgerät
JPS6052021A (ja) * 1983-08-31 1985-03-23 Canon Inc 位置検出方法
DE3703449C2 (de) * 1987-02-05 1998-07-23 Truetzschler Gmbh & Co Kg Vorrichtung zum Ermitteln von Fremdkörpern, wie Metallteilen, Drähten o. dgl. innerhalb von bzw. zwischen Textilfaserflocken
US5493391A (en) * 1994-07-11 1996-02-20 Sandia Corporation One dimensional wavefront distortion sensor comprising a lens array system
US5864381A (en) * 1996-07-10 1999-01-26 Sandia Corporation Automated pupil remapping with binary optics
CN101532879B (zh) * 2009-04-10 2010-10-20 重庆大学 基于菲涅尔波带片的微光谱分析方法及器件
US20170325744A1 (en) * 2016-05-10 2017-11-16 Apple Inc. Systems and methods for increasing localized pressure to improve ppg motion performance
WO2017197033A1 (en) 2016-05-10 2017-11-16 Apple Inc. Systems and methods for non-pulsatile blood volume measurements
US10697830B1 (en) 2016-08-31 2020-06-30 Apple Inc. Multicomb light source and spectrometer
CN111149265B (zh) 2017-09-28 2021-09-10 苹果公司 使用量子阱混合技术的激光架构
US11552454B1 (en) 2017-09-28 2023-01-10 Apple Inc. Integrated laser source
US11171464B1 (en) 2018-12-14 2021-11-09 Apple Inc. Laser integration techniques
US12204155B2 (en) 2021-09-24 2025-01-21 Apple Inc. Chip-to-chip optical coupling for photonic integrated circuits

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50109005A (en, 2012) * 1974-02-09 1975-08-27
JPS5248031A (en) * 1975-10-14 1977-04-16 Mitsubishi Electric Corp Control device for in-door wiring connected apparatus

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2272097A (en) * 1940-02-29 1942-02-03 Westinghouse Electric & Mfg Co Lens assembly for straight line scanning
DE1938083B2 (de) * 1969-07-26 1972-05-10 Mahlo Gmbh, 8424 Saal Verfahren zur automatischen fehlerueberwachung flaechenfoermiger werkstuecke mittels einer anzahl parallel nebeneinander angeordneter abtastsysteme
US3756725A (en) * 1970-10-12 1973-09-04 Harris Intertype Corp Measurement and control of ink density
GB1379593A (en) * 1971-05-21 1975-01-02 Agfa Gevaert Device for sensing a moving sheet material for imperfections
DE2157247A1 (de) * 1971-11-18 1973-05-24 Paul Lippke Einrichtung zum elektro-optischen feststellen von loechern in bewegten bahnen aus papier und dgl
GB1526930A (en) * 1974-12-19 1978-10-04 Bfg Glassgroup Process and apparatus for testing glass
DE2533214C3 (de) * 1975-07-25 1980-10-09 Siemens Ag, 1000 Berlin Und 8000 Muenchen Vorrichtung zur Erfassung der Einfallsrichtung elektromagnetischer Strahlung

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50109005A (en, 2012) * 1974-02-09 1975-08-27
JPS5248031A (en) * 1975-10-14 1977-04-16 Mitsubishi Electric Corp Control device for in-door wiring connected apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6275236A (ja) * 1985-09-30 1987-04-07 Toshiba Corp 表面検査装置

Also Published As

Publication number Publication date
GB2015728A (en) 1979-09-12
JPS6234097B2 (en, 2012) 1987-07-24
DE2808360C3 (de) 1981-09-24
SE7901692L (sv) 1979-08-28
GB2015728B (en) 1982-09-02
DE2808360A1 (de) 1979-08-30
US4227091A (en) 1980-10-07
SE434780B (sv) 1984-08-13
DE2808360B2 (de) 1980-11-13

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