JPS54143193A - Deffct testing method and apparatus for packaged articles - Google Patents
Deffct testing method and apparatus for packaged articlesInfo
- Publication number
- JPS54143193A JPS54143193A JP4978278A JP4978278A JPS54143193A JP S54143193 A JPS54143193 A JP S54143193A JP 4978278 A JP4978278 A JP 4978278A JP 4978278 A JP4978278 A JP 4978278A JP S54143193 A JPS54143193 A JP S54143193A
- Authority
- JP
- Japan
- Prior art keywords
- mask
- sheet
- deffct
- improve
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/3404—Sorting according to other particular properties according to properties of containers or receptacles, e.g. rigidity, leaks, fill-level
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Abstract
PURPOSE:To improve the accuracy of package tests by subjecting the portion other than the test area to mask treatment so that the signal output from the unnecessary portion may be eliminated. CONSTITUTION:A mask 21 is formed with a slot-shaped aperture or transparent portion 23 corresponding to a pocket 22 for receiving each product. On the other hand, the mask 21 itself is made of such a suitable material as can prevent the signals from the undesired portion from passing therethrough. The mask 21 is arranged between the sheet 1 and an image sensor 4 above a conveyor 2 by which the PTP sheet is conveyed. As a result, the sensor 4 is shielded from the light from above the sheet so that only the light from the product or the test piece can come. On the other hand, the testing mask at the sheet portion has its transparent and shielding portions reversed from those of the mask 21. By masking the portion other than the test area to block the generation of the undesired signals, it is possible to improve the testing accuracy.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4978278A JPS54143193A (en) | 1978-04-28 | 1978-04-28 | Deffct testing method and apparatus for packaged articles |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4978278A JPS54143193A (en) | 1978-04-28 | 1978-04-28 | Deffct testing method and apparatus for packaged articles |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54143193A true JPS54143193A (en) | 1979-11-08 |
Family
ID=12840722
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4978278A Pending JPS54143193A (en) | 1978-04-28 | 1978-04-28 | Deffct testing method and apparatus for packaged articles |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54143193A (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62163950A (en) * | 1986-01-14 | 1987-07-20 | Eisai Co Ltd | Method and apparatus for detecting defective thermally adhered seal of ptp packed body |
JPS62259046A (en) * | 1986-05-02 | 1987-11-11 | Fuji Photo Film Co Ltd | Inspection method for surface of magnetic disk |
EP0375315A2 (en) * | 1988-12-23 | 1990-06-27 | Shionogi Europe B.V. | Capsule-inspection apparatus |
WO1998058241A1 (en) * | 1997-06-17 | 1998-12-23 | Yuki Engineering System, Ltd | Device for checking sheet packaging |
JP2001041894A (en) * | 1997-06-17 | 2001-02-16 | Yuki Gijutsu Sogo:Kk | Apparatus and method for inspecting sheet package |
JP2001041900A (en) * | 1997-11-07 | 2001-02-16 | Yuki Gijutsu Sogo:Kk | Sheet package inspecting apparatus |
JP2007121290A (en) * | 2005-10-24 | 2007-05-17 | General Electric Co <Ge> | Method and device for generating mask |
JP2007327751A (en) * | 2006-06-06 | 2007-12-20 | Ckd Corp | Visual inspection apparatus and ptp sheet manufacturing apparatus |
JP2019207193A (en) * | 2018-05-30 | 2019-12-05 | Ckd株式会社 | Inspection device and ptp packing machine |
-
1978
- 1978-04-28 JP JP4978278A patent/JPS54143193A/en active Pending
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62163950A (en) * | 1986-01-14 | 1987-07-20 | Eisai Co Ltd | Method and apparatus for detecting defective thermally adhered seal of ptp packed body |
JPS62259046A (en) * | 1986-05-02 | 1987-11-11 | Fuji Photo Film Co Ltd | Inspection method for surface of magnetic disk |
US4789238A (en) * | 1986-05-02 | 1988-12-06 | Fuji Photo Film Co., Ltd. | Method of inspecting magnetic disk surface |
EP0375315A2 (en) * | 1988-12-23 | 1990-06-27 | Shionogi Europe B.V. | Capsule-inspection apparatus |
US6445452B1 (en) | 1997-06-17 | 2002-09-03 | Yuki Engineering System Co., Ltd. | Device for checking sheet packaging |
WO1998058241A1 (en) * | 1997-06-17 | 1998-12-23 | Yuki Engineering System, Ltd | Device for checking sheet packaging |
JP2001041894A (en) * | 1997-06-17 | 2001-02-16 | Yuki Gijutsu Sogo:Kk | Apparatus and method for inspecting sheet package |
JP2001041900A (en) * | 1997-11-07 | 2001-02-16 | Yuki Gijutsu Sogo:Kk | Sheet package inspecting apparatus |
JP2007121290A (en) * | 2005-10-24 | 2007-05-17 | General Electric Co <Ge> | Method and device for generating mask |
JP2007327751A (en) * | 2006-06-06 | 2007-12-20 | Ckd Corp | Visual inspection apparatus and ptp sheet manufacturing apparatus |
JP2019207193A (en) * | 2018-05-30 | 2019-12-05 | Ckd株式会社 | Inspection device and ptp packing machine |
WO2019230051A1 (en) * | 2018-05-30 | 2019-12-05 | Ckd株式会社 | Inspecting device, and ptp packing machine |
CN112262311A (en) * | 2018-05-30 | 2021-01-22 | Ckd株式会社 | Inspection device and PTP packaging machine |
US11414231B2 (en) | 2018-05-30 | 2022-08-16 | Ckd Corporation | Inspection device and PTP packaging machine |
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