JPS5413367A - Method of controlling thickness of evaporated film in photoelectric type film thickness meter - Google Patents
Method of controlling thickness of evaporated film in photoelectric type film thickness meterInfo
- Publication number
- JPS5413367A JPS5413367A JP7773077A JP7773077A JPS5413367A JP S5413367 A JPS5413367 A JP S5413367A JP 7773077 A JP7773077 A JP 7773077A JP 7773077 A JP7773077 A JP 7773077A JP S5413367 A JPS5413367 A JP S5413367A
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- film
- photoelectric type
- controlling
- evaporated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7773077A JPS5413367A (en) | 1977-07-01 | 1977-07-01 | Method of controlling thickness of evaporated film in photoelectric type film thickness meter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7773077A JPS5413367A (en) | 1977-07-01 | 1977-07-01 | Method of controlling thickness of evaporated film in photoelectric type film thickness meter |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5413367A true JPS5413367A (en) | 1979-01-31 |
JPS5724485B2 JPS5724485B2 (en) | 1982-05-25 |
Family
ID=13642007
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7773077A Granted JPS5413367A (en) | 1977-07-01 | 1977-07-01 | Method of controlling thickness of evaporated film in photoelectric type film thickness meter |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5413367A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60242307A (en) * | 1984-05-17 | 1985-12-02 | Matsushita Electric Ind Co Ltd | Control method of film thickness |
US8174757B2 (en) | 2002-01-04 | 2012-05-08 | The Furukawa Electric Co., Ltd. | Wavelength determining apparatus, method and program for thin film thickness monitoring light |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5410411A (en) * | 1992-01-17 | 1995-04-25 | Matsushita Electric Industrial Co., Ltd. | Method of and apparatus for forming multi-layer film |
JP4491289B2 (en) * | 2004-06-29 | 2010-06-30 | Hoya株式会社 | Thin film forming apparatus and method |
-
1977
- 1977-07-01 JP JP7773077A patent/JPS5413367A/en active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60242307A (en) * | 1984-05-17 | 1985-12-02 | Matsushita Electric Ind Co Ltd | Control method of film thickness |
JPH0575966B2 (en) * | 1984-05-17 | 1993-10-21 | Matsushita Electric Ind Co Ltd | |
US8174757B2 (en) | 2002-01-04 | 2012-05-08 | The Furukawa Electric Co., Ltd. | Wavelength determining apparatus, method and program for thin film thickness monitoring light |
Also Published As
Publication number | Publication date |
---|---|
JPS5724485B2 (en) | 1982-05-25 |
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