JPS5396680A - Photo element measuring instrument - Google Patents

Photo element measuring instrument

Info

Publication number
JPS5396680A
JPS5396680A JP1052977A JP1052977A JPS5396680A JP S5396680 A JPS5396680 A JP S5396680A JP 1052977 A JP1052977 A JP 1052977A JP 1052977 A JP1052977 A JP 1052977A JP S5396680 A JPS5396680 A JP S5396680A
Authority
JP
Japan
Prior art keywords
measuring instrument
photo element
element measuring
sine wave
measures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1052977A
Other languages
Japanese (ja)
Inventor
Munehiko Nagano
Rumiko Suganuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP1052977A priority Critical patent/JPS5396680A/en
Publication of JPS5396680A publication Critical patent/JPS5396680A/en
Pending legal-status Critical Current

Links

Landscapes

  • Light Receiving Elements (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

PURPOSE: To make it possible to measure the mean ionization time equivalently at high accuracy from the phase variation of a sine wave signal by receiving sine wave modulation light by means of the photo element measuring instrument which measures the answer speed of an avalanche photodiode.
COPYRIGHT: (C)1978,JPO&Japio
JP1052977A 1977-02-02 1977-02-02 Photo element measuring instrument Pending JPS5396680A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1052977A JPS5396680A (en) 1977-02-02 1977-02-02 Photo element measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1052977A JPS5396680A (en) 1977-02-02 1977-02-02 Photo element measuring instrument

Publications (1)

Publication Number Publication Date
JPS5396680A true JPS5396680A (en) 1978-08-24

Family

ID=11752771

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1052977A Pending JPS5396680A (en) 1977-02-02 1977-02-02 Photo element measuring instrument

Country Status (1)

Country Link
JP (1) JPS5396680A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58166273A (en) * 1982-03-26 1983-10-01 Toshiba Corp Responding property control device of phototransistor
JPS6176967A (en) * 1984-09-21 1986-04-19 Toshiba Corp Sensitivity measuring device
JPS6429780A (en) * 1987-07-24 1989-01-31 Nec Corp Optical semiconductor measuring instrument

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58166273A (en) * 1982-03-26 1983-10-01 Toshiba Corp Responding property control device of phototransistor
JPH0332754B2 (en) * 1982-03-26 1991-05-14 Tokyo Shibaura Electric Co
JPS6176967A (en) * 1984-09-21 1986-04-19 Toshiba Corp Sensitivity measuring device
JPS6429780A (en) * 1987-07-24 1989-01-31 Nec Corp Optical semiconductor measuring instrument

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