JPS538155A - Viewing photographying and temperature measuring method of high temperature microscope - Google Patents

Viewing photographying and temperature measuring method of high temperature microscope

Info

Publication number
JPS538155A
JPS538155A JP8147976A JP8147976A JPS538155A JP S538155 A JPS538155 A JP S538155A JP 8147976 A JP8147976 A JP 8147976A JP 8147976 A JP8147976 A JP 8147976A JP S538155 A JPS538155 A JP S538155A
Authority
JP
Japan
Prior art keywords
photographying
viewing
measuring method
microscope
high temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8147976A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5542368B2 (enrdf_load_stackoverflow
Inventor
Tadami Taoka
Fumio Nakajima
Hisashi Kawamura
Yutaka Hirano
Kimio Maru
Kazutoshi Arita
Hidemasa Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UNION KOUGAKU KK
Original Assignee
UNION KOUGAKU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UNION KOUGAKU KK filed Critical UNION KOUGAKU KK
Priority to JP8147976A priority Critical patent/JPS538155A/ja
Priority to DE19762644299 priority patent/DE2644299C3/de
Publication of JPS538155A publication Critical patent/JPS538155A/ja
Publication of JPS5542368B2 publication Critical patent/JPS5542368B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/60—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
    • G01J5/602—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature using selective, monochromatic or bandpass filtering
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Radiation Pyrometers (AREA)
  • Microscoopes, Condenser (AREA)
JP8147976A 1976-07-10 1976-07-10 Viewing photographying and temperature measuring method of high temperature microscope Granted JPS538155A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP8147976A JPS538155A (en) 1976-07-10 1976-07-10 Viewing photographying and temperature measuring method of high temperature microscope
DE19762644299 DE2644299C3 (de) 1976-07-10 1976-09-30 Hochtemperaturmikroskop

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8147976A JPS538155A (en) 1976-07-10 1976-07-10 Viewing photographying and temperature measuring method of high temperature microscope

Publications (2)

Publication Number Publication Date
JPS538155A true JPS538155A (en) 1978-01-25
JPS5542368B2 JPS5542368B2 (enrdf_load_stackoverflow) 1980-10-30

Family

ID=13747532

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8147976A Granted JPS538155A (en) 1976-07-10 1976-07-10 Viewing photographying and temperature measuring method of high temperature microscope

Country Status (2)

Country Link
JP (1) JPS538155A (enrdf_load_stackoverflow)
DE (1) DE2644299C3 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57183830A (en) * 1981-05-07 1982-11-12 Olympus Optical Co Photographing system of eye bottom camera
JP2009031294A (ja) * 2007-07-30 2009-02-12 Ivoclar Vivadent Ag 部材の表面上で進行する物理および／または化学プロセスの経過を光学的に検査する方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19643574C2 (de) * 1996-10-11 1999-12-23 Ver Energiewerke Ag Verfahren zur Bestimmung des Zustandes eines Weichstoffkompensators für die Abdichtung an einem Dampfkessel

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57183830A (en) * 1981-05-07 1982-11-12 Olympus Optical Co Photographing system of eye bottom camera
JP2009031294A (ja) * 2007-07-30 2009-02-12 Ivoclar Vivadent Ag 部材の表面上で進行する物理および／または化学プロセスの経過を光学的に検査する方法

Also Published As

Publication number Publication date
DE2644299C3 (de) 1979-11-22
DE2644299B2 (de) 1979-03-29
JPS5542368B2 (enrdf_load_stackoverflow) 1980-10-30
DE2644299A1 (de) 1978-01-12

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